The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Nov. 19, 2004
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
John William Ertel, New Vienna, OH (US);
William Stewart Mcknight, Hamilton, OH (US);
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
John William Ertel, New Vienna, OH (US);
William Stewart McKnight, Hamilton, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.