The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2010
Filed:
Dec. 29, 2006
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
William Stewart Mcknight, Hamilton, OH (US);
Preeti Pisupati, Bangalore, IN;
Peyush Kumar Mishra, Bangalore, IN;
Sandeep Kumar Dewangan, Bangalore, IN;
Changting Wang, Niskayuna, NY (US);
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
William Stewart McKnight, Hamilton, OH (US);
Preeti Pisupati, Bangalore, IN;
Peyush Kumar Mishra, Bangalore, IN;
Sandeep Kumar Dewangan, Bangalore, IN;
Changting Wang, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.