Peyush Kumar Mishra

Title: Peyush Kumar Mishra: Innovator in Multi-Frequency Image Processing

Introduction

Peyush Kumar Mishra is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of image processing, particularly in the inspection of parts with complex geometric shapes. His innovative approach has led to the development of a unique method that enhances the detection of small cracks and anomalies in intricate components.

Latest Patents

Mishra holds a patent for a method titled "Multi-frequency image processing for inspecting parts having complex geometric shapes." This patent describes a technique that utilizes eddy current inspection to collect data from multi-frequency eddy current signals. The method employs phase analysis to combine this data, improving the signal-to-noise ratio of the raw inspection image. Furthermore, the image is reprocessed using a spatiotemporal filter, which correlates with the frequency components of the eddy current flaw signal. This process effectively separates signals associated with cracks and other flaws that are typically obscured by edge effect signals.

Career Highlights

Peyush Kumar Mishra is currently employed at General Electric Company, where he continues to apply his expertise in image processing and inspection technologies. His work has been instrumental in advancing the capabilities of inspection methods used in various industries.

Collaborations

Mishra has collaborated with notable colleagues, including Ui Won Suh and Gigi Olive Gambrell. These partnerships have contributed to the development and refinement of innovative technologies in their respective fields.

Conclusion

Peyush Kumar Mishra's contributions to multi-frequency image processing exemplify the impact of innovation in engineering and technology. His patent and ongoing work at General Electric Company highlight his commitment to enhancing inspection methods for complex geometries.