The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2004
Filed:
Feb. 05, 2002
Applicant:
Inventors:
Dominick A. Casarcia, Osgood, IN (US);
Douglas E. Ingram, Cincinnati, OH (US);
William S. McKnight, Fairfield, OH (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/500 ; G01N 2/772 ;
U.S. Cl.
CPC ...
G01R 3/500 ; G01N 2/772 ;
Abstract
A method for inspecting a metallic component comprises providing an inspection standard having an eddy current signature substantially similar to an eddy current signature of the metallic component, wherein the inspection standard body is fabricated from a non-metallic material. The method also comprises inspecting the metallic component with an eddy current probe with reference to the inspection standard.
Casarcia, Dominick. (2004). Method and inspection standard for eddy current inspection (U.S. Patent No. 6696830). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6696830
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile