General Electric Company

William Stewart McKnight

Ui Won Suh

Changting Wang

Gigi Olive Gambrell

Yuri Alexeyevich Plotnikov

John William Ertel

Shridhar Champaknath Nath

Douglas Edward Ingram

Haiyan Sun

Preeti Pisupati

Thomas James Batzinger

Francis Howard Little

Curtis Wayne Rose

Vamshi Krishna Reddy Kommareddy

Ralph Gerald Isaacs

Richard L Trantow

Richard K Davis

Mandar Diwakar Godbole

Sandeep Kumar Dewangan

Dominick A Casarcia

Prafull Sharma

Shyamsunder Tondanur Mandayam

Yury Alexeyevich Plotnikov

Sandie Elizabeth Gresham

Walter Joseph Bantz

Suneel Tumkur Shankarappa

Mottito Togo

Serkan Ertekin

Anjani Narendra Schrad

Peyush Kumar Mishra

An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.

System and method for eddy current inspection of parts with complex geometries

A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.

Methods and apparatus for testing a component

An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.

System and method for inspection of parts with an eddy current probe

A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.

Flexible eddy current array probe and methods of assembling the same

A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.

Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same

A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.

Multi-frequency image processing for inspecting parts having complex geometric shapes

A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.

A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.

A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.

Method for performing model based scanplan generation of a component under inspection

A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.

Inspection method and system using multifrequency phase analysis

An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

Eddy current probe and inspection method

An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.

Omnidirectional eddy current probe and inspection system

The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.

Molded eddy current array probe

A method for inspecting a metallic component comprises providing an inspection standard having an eddy current signature substantially similar to an eddy current signature of the metallic component, wherein the inspection standard body is fabricated from a non-metallic material. The method also comprises inspecting the metallic component with an eddy current probe with reference to the inspection standard.

Method and inspection standard for eddy current inspection

A non-cutting tool or stylus (32), mounted in a position where a tool normally resides on a turret (26) of a numerically controlled machining system, rubs against the workpiece (41) as it rotates. The rubbing vibrations emanating from the workpiece (41) are picked up as a touch signal by an accelerometer (62) whose output signal is conditioned and fed to the numerical control (46). Diameter measurements, for example, are made directly by touching two opposing points on the workpiece (41) on opposite sides of the machine centerline (14) whereupon a difference calculation is made to provide the required diameter measurement.

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Hamilton, OH, United States of America

William Stewart McKnight