Yokohama, Japan

Shuji Kikuchi


Average Co-Inventor Count = 3.6

ph-index = 6

Forward Citations = 93(Granted Patents)


Location History:

  • Kanagawa, JP (1991)
  • Yokohama, JP (1988 - 2014)

Company Filing History:


Years Active: 1988-2014

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12 patents (USPTO):Explore Patents

Title: Shuji Kikuchi: Innovator in Semiconductor Inspection Technologies

Introduction

Shuji Kikuchi, an accomplished inventor based in Yokohama, Japan, has made significant contributions to the field of semiconductor technology. With 12 patents to his name, Kikuchi has developed innovative solutions that enhance the efficiency and effectiveness of semiconductor inspections.

Latest Patents

Among Shuji Kikuchi's notable inventions is a Charged Particle Beam Device, which serves as an advanced inspection device. This technology enables flexible changes to various scanning sequences based on specific inspection conditions while minimizing unevenness in the scanning cycle that may destabilize charging. The beam scanning scheduler within this device adapts the scanning sequences according to inputted conditions, allowing for precise control of beam scanning on a pixel-by-pixel basis.

Another key patent is the Method and Apparatus for Inspecting Defects of Semiconductor Devices. This invention addresses the limitations faced during repetitive computation of area data linked to defect detection in semiconductor devices. It features a sophisticated data memory system that enables simultaneous read and write access, along with multiple numerical computation units that streamline processing and improve operational speed.

Career Highlights

Shuji Kikuchi's professional journey includes impactful stints at renowned companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience at these organizations has undoubtedly shaped his inventive capabilities and understanding of industry needs.

Collaborations

Throughout his career, Kikuchi has collaborated with notable professionals, including Tadanobu Toba and Katsunori Hirano. These partnerships have likely contributed to the innovative edge seen in his inventions, fostering an environment of collective creativity and technical excellence.

Conclusion

Shuji Kikuchi's innovations in semiconductor inspection technologies exemplify his dedication to advancing the field. His array of patents highlights his ability to address complex challenges and provide effective solutions. With a proven track record and collaborative spirit, Kikuchi continues to be a prominent figure in the world of inventors, influencing the future of semiconductor technology.

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