The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Sep. 27, 2004
Applicants:
Iwao Suzuki, Hamura, JP;
Shuji Kikuchi, Yokohama, JP;
Fumie Kobayashi, Fussa, JP;
Hideyuki Aoki, Takasaki, JP;
Inventors:
Iwao Suzuki, Hamura, JP;
Shuji Kikuchi, Yokohama, JP;
Fumie Kobayashi, Fussa, JP;
Hideyuki Aoki, Takasaki, JP;
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.