Santosh Bhattacharyya

Title: Santosh Bhattacharyya: Innovator in Defect Detection Technologies

Introduction

Santosh Bhattacharyya, based in San Jose, California, is a prominent inventor recognized for his significant contributions to the field of defect detection technologies. With a remarkable portfolio of 20 patents, his innovations have played a crucial role in advancing the capabilities of scanning electron microscopes (SEM) and deep learning applications in defect identification.

Latest Patents

Santosh's latest inventions include:

1. **BBP Assisted Defect Detection Flow for SEM Images** - This patent details a method where a rendered image is aligned with a SEM image to produce an aligned rendered image. It also involves the alignment of a reference image with the SEM image, generating a threshold probability map, and the dynamic compensation of both images to create corrected versions. This system is designed to filter defects using a broadband-plasma-based property to produce clusters of defects of interest.

2. **System and Method for Difference Filter and Aperture Selection Using Shallow Deep Learning** - This innovative patent describes a system for defect review and classification. The controller within the system is configured to receive training images that include various defects and apply different filters to classify their effectiveness. The result is a deep learning network classifier that helps optimize defect identification processes.

Career Highlights

Santosh has made significant strides in his career by working with notable companies, including KLA Tencor Corporation and KLA Corporation. His experiences in these organizations have enabled him to develop advanced technologies that are widely recognized within the industry.

Collaborations

Throughout his career, Santosh has collaborated with esteemed colleagues such as Ashok V. Kulkarni and Bjorn Brauer. These partnerships have allowed for the exchange of ideas and have contributed to the successful development of innovative solutions in defect detection.

Conclusion

Santosh Bhattacharyya stands out as a dedicated inventor whose work has greatly impacted defect detection technology. With a strong portfolio of patents and successful collaborations, he continues to pave the way for future advancements in the field. His commitment to innovation exemplifies the drive necessary for solving complex challenges in technology.