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For the Inventor, By the Inventor

Fremont, CA, United States of America

Norman H Chang

This inventor holds 41 USPTO granted patents and 1 published patent application, primarily in Thermal Analysis. Top assignees: Ansys, Inc., Hewlett-Packard Company, Hewlett-Packard Development Company, L.p.. Active years: 1997-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norman H Chang. Retrieved from https://idiyas.com/inventor/norman-h-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 41 

% Patents Active = 95.1

Average Co-Inventor Count = 4.7

ph-index = 8

Forward Citations = 324(Granted Patents)


Company Filing History:

goldMedal29 out of 215 
 
Ansys, Inc.
 patents
silverMedal5 out of 9,639 
 
Hewlett-Packard Company
 patents
bronzeMedal5 out of 27,691 
 
Hewlett-Packard Development Company, L.p.
 patents
4. 1 out of 5 
 
Apache Design Solutions, Inc.
 patents
5. 1 out of 89 
 
Hewlett-Packard Development, L.p.
 patents

Years Active: 1997-2026

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Areas of Expertise:
Thermal Analysis
Machine Learning
Side-Channel Security
Chip Reliability
Electromagnetic Simulation
Power Management
Leakage Detection
Circuit Simulation
Silicon Density
Transient Thermal Response
Joule Heating
Design Parameter Violations
41 patents (USPTO):Explore Patents
1. 12769917 - Simulation based analysis of electromagnetic fault injection (2026-10-20),
2. 12701003 - Machine learning for automatic identification of points of interest for side channel leakage (2026-08-04),
3. 12694183 - Multiscale thermal reduced order model for transient IC analysis (2026-07-28),
4. 12581913 - Steady-state IC thermal analysis with thermal decay curve characterization (2026-03-17),
5. 12566909 - Prediction of steady state heat maps for chip thermal analysis (2026-03-03),
6. 12536294 - Security-aware design with placement for power/emag assessment (2026-01-27),
7. 12412110 - Systems and methods for machine learning based risky circuit pattern identification (2025-09-09),
8. 12393686 - Adaptive leakage impact region detection and modeling for counterfeit chips detection (2025-08-19),
9. 12307184 - Methods and systems for predicting silicon density for a metal layer of semi-conductor chip via machine learning (2025-05-20),
10. 12277371 - Dynamic current modeling in dynamic voltage drop analysis (2025-04-14),
11. 12242781 - Systems and methods for machine learning based fast static thermal solver (2025-03-04),
12. 12177349 - Machine learning for automatic identification of points of interest for side channel leakage (2024-12-24),
13. 11995187 - Systems and methods for a comprehensive and efficient simulation-based methodology on IP authentication and trojan detection (2024-05-28),
14. 11973868 - Systems and methods for a fast near-field electromagnetic simulation methodology for side-channel emission analysis (2024-04-30),
15. 11914931 - Predicting on chip transient thermal response in a multi-chip system using an RNN-based predictor (2024-02-27),

Title: The Innovative Journey of Norman H Chang

Introduction: Norman H Chang is a distinguished inventor based in Fremont, California, known for his groundbreaking contributions to various technological fields.

Latest Patents: Norman H Chang holds several patents in the areas of electronics, software development, and renewable energy technologies, showcasing his versatility and ingenuity.

Career Highlights: With a career spanning over two decades, Norman H Chang has worked with leading tech companies, research institutions, and universities, playing a pivotal role in developing cutting-edge solutions and products.

Collaborations: Throughout his career, Norman H Chang has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and excellence in every project he undertakes.

Conclusion: Norman H Chang's passion for innovation, coupled with his relentless pursuit of technological advancement, continues to inspire the next generation of inventors and visionaries worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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