Enter inventor name

Average Co-Inventor Count = 2.3

ph-index = 13

Forward Citations = 667(Granted Patents)

Forward Citations (Not Self Cited) = 610(Dec 10, 2025)

Location History:

San Francisco, CA (US) (2000 - 2006)
Palo Alto, CA (US) (2005 - 2022)
San Jose, CA (US) (2022 - 2024)

Company Filing History:

18 out of 641

Kla-tencor Technologies Corporation

patents

9 out of 13,713

Applied Materials, Inc.

patents

6 out of 1,787

Kla Tencor Corporation

patents

4. 5 out of 203

Pdf Solutions, Incorporated

Electron Optica, Inc.

patents

7. 1 out of 5,309

Leland Stanford Junior University

patents

8. 2 out of 832,843

Other

patents

Years Active: 2000-2025

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Areas of Expertise:

Non-Contact Electrical Measurement

Aberration Correction

Electron Microscopy

E-Beam Inspection

Electron Beam Lithography

High Vacuum Components

Photocathode Source

Dual-Energy Electron Flooding

Optical Coupling

Charged Particle Beam

High-Throughput Inspection

Mirror Monochromator

51 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),

2. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),

3. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),

4. 11456148 - Aberration reduction in multipass electron microscopy (2022-09-27),

5. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),

6. 11276549 - Compact arrangement for aberration correction of electron lenses (2022-03-15),

7. 9496119 - E-beam inspection apparatus and method of using the same on various integrated circuit chips (2016-11-15),

8. 9406479 - Mirror pulse compressor for electron beam apparatus (2016-08-02),

9. 8729466 - Aberration-corrected and energy-filtered low energy electron microscope with monochromatic dual beam illumination (2014-05-20),

10. 8461526 - Electron beam column and methods of using same (2013-06-11),

11. 8334508 - Mirror energy filter for electron beam apparatus (2012-12-18),

12. 8294125 - High-sensitivity and high-throughput electron beam inspection column enabled by adjustable beam-limiting aperture (2012-10-23),

13. 8258474 - Compact arrangement for dual-beam low energy electron microscope (2012-09-04),

14. 8183526 - Mirror monochromator for charged particle beam apparatus (2012-05-22),

15. 8092927 - Shielding, particulate reducing high vacuum components (2012-01-10),

Title: The Innovative Journey of Marian Mankos

Introduction: Marian Mankos, a talented inventor based in Palo Alto, CA, has been making waves in the world of technology with her groundbreaking creations.

Latest Patents: Marian Mankos holds several patents in the field of artificial intelligence and renewable energy technologies, showcasing her versatility and forward-thinking approach.

Career Highlights: With a background in engineering and a passion for sustainability, Marian has led numerous projects that have revolutionized the way we approach environmental challenges. Her work has been recognized globally for its impact and ingenuity.

Collaborations: Marian Mankos has collaborated with leading research institutions and tech companies to further her innovative ideas and bring them to life. Her ability to work across disciplines has led to the development of cutting-edge solutions.

Conclusion: Marian Mankos continues to inspire with her dedication to creating a more sustainable and technologically advanced future. Her inventive spirit and commitment to making a difference set her apart as a true pioneer in the world of innovation.

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