The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Jun. 25, 2015
Applicant:

Marian Mankos, Palo Alto, CA (US);

Inventor:

Marian Mankos, Palo Alto, CA (US);

Assignee:

Electron Optica, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/04 (2006.01); H01J 37/147 (2006.01); H01J 37/285 (2006.01); H01J 37/28 (2006.01); H01J 37/20 (2006.01); H01J 37/14 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1471 (2013.01); H01J 37/14 (2013.01); H01J 37/20 (2013.01); H01J 37/28 (2013.01); H01J 37/285 (2013.01); H01J 2237/1523 (2013.01); H01J 2237/2802 (2013.01);
Abstract

One embodiment pertains to an apparatus for compressing an electron pulse. An electron source is illuminated by a pulsed laser and generates a pulse of electrons. The pulse enters a beam separator which deflects the electrons by 90 degrees into an electron mirror. The faster, higher energy electrons form the leading edge of the pulse and penetrate more deeply into the retarding field of the electron mirror than the lower energy electrons. After reflection, the lower energy electrons exit the electron mirror before the higher energy electrons and form the leading edge of the pulse. The reflected pulse reenters the separator and is deflected by 90 degrees towards the specimen. The fast, higher energy electrons catch up with the slow, low energy electrons as the electrons strike the specimen. The electrons are scattered by the specimen and used to form a two-dimensional image or diffraction pattern of the specimen.


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