Mari Nozoe

This inventor holds 73 USPTO granted patents and 2 published patent applications, primarily in Charged Particle Beam Inspection (CPC class H01J). Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi Tokyo Electronics Co., Ltd.. Active years: 1999-2014.

USPTO Granted Patents = 73 (Patent Applications = 2)

% Patents Active = 49.3

Average Co-Inventor Count = 4.6

ph-index = 21

Forward Citations = 1,203(Granted Patents)

Forward Citations (Not Self Cited) = 1,159(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Chiyoda-ku, Tokyo JP (2003)
Oume, JP (2000 - 2007)
Ome, JP (1999 - 2011)
Hino, JP (2002 - 2014)

Company Filing History:

Hitachi-High-Technologies Corporation

patents

2 out of 21

Hitachi Tokyo Electronics Co., Ltd.

patents

4. 1 out of 3,781

Renesas Technology Corp.

patents

5. 5 out of 834,350

Other

patents

where one patent can have more than one assignee

Years Active: 1999-2014

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Areas of Expertise:

Charged Particle Beam

Inspection Method

Integrated Circuit

Semiconductor Device

Pattern Check

Electron Beam

Wafer Inspection

Pattern Inspection

Microscopy

Irradiation Method

Patterned Wafer

Sample Observation

73 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8907278 - Charged particle beam applied apparatus, and irradiation method (2014-12-09),

2. 8558173 - Method of inspecting pattern and inspecting instrument (2013-10-15),

3. 8552373 - Charged particle beam device and sample observation method (2013-10-08),

4. 8421008 - Pattern check device and pattern check method (2013-04-16),

5. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),

6. 7876113 - Method of inspecting pattern and inspecting instrument (2011-01-25),

7. 7526747 - Inspection method and inspection system using charged particle beam (2009-04-28),

8. 7521679 - Inspection method and inspection system using charged particle beam (2009-04-21),

9. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),

10. 7397031 - Method of inspecting a circuit pattern and inspecting instrument (2008-07-08),

11. 7394070 - Method and apparatus for inspecting patterns (2008-07-01),

12. 7375538 - Method of inspecting pattern and inspecting instrument (2008-05-20),

13. 7276693 - Inspection method and apparatus using charged particle beam (2007-10-02),

14. 7271385 - Inspection method and inspection apparatus using electron beam (2007-09-18),

15. 7260256 - Method and system for inspecting a pattern (2007-08-21),

Title: Mari Nozoe - Pioneering Female Inventor from Hino, Japan

Introduction: Mari Nozoe is a trailblazing inventor hailing from Hino, Japan, known for her groundbreaking contributions to the field of technology and innovation.

Latest Patents: Mari Nozoe holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing her versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Mari Nozoe has worked with top research institutions and universities in Japan, spearheading projects that have led to significant advancements in various industries.

Collaborations: Throughout her career, Mari Nozoe has collaborated with leading companies in Japan and internationally, fostering innovation and driving progress in the global tech landscape.

Conclusion: Mari Nozoe's dedication to innovation, coupled with her passion for creating a sustainable future through technology, solidifies her status as a pioneering female inventor in the world of inventions and patents.