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Mari Nozoe

USPTO Granted Patents = 73 (Patent Applications = 2)

Average Co-Inventor Count = 4.6

ph-index = 21

Forward Citations = 1,202(Granted Patents)

Forward Citations (Not Self Cited) = 1,159(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Chiyoda-ku, Tokyo JP (2003)
Oume, JP (2000 - 2007)
Ome, JP (1999 - 2011)
Hino, JP (2002 - 2014)

Company Filing History:

57 out of 42,496

11 out of 2,874

Hitachi-high-technologies Corporation

Hitachi Tokyo Electronics Co., Ltd.

4. 1 out of 3,781

Renesas Technology Corp.

5. 5 out of 832,843

Other

patents

where one patent can have more than one assignee

Years Active: 1999-2014

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Areas of Expertise:

Charged Particle Beam

Electron Beam Inspection

Integrated Circuit Pattern

Semiconductor Manufacturing

Pattern Inspection

Wafer Inspection

Inspection Method

Inspection Apparatus

Pattern Check Device

Circuit Pattern Inspection

Sample Observation

Process Management

73 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8907278 - Charged particle beam applied apparatus, and irradiation method (2014-12-09),

2. 8558173 - Method of inspecting pattern and inspecting instrument (2013-10-15),

3. 8552373 - Charged particle beam device and sample observation method (2013-10-08),

4. 8421008 - Pattern check device and pattern check method (2013-04-16),

5. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),

6. 7876113 - Method of inspecting pattern and inspecting instrument (2011-01-25),

7. 7526747 - Inspection method and inspection system using charged particle beam (2009-04-28),

8. 7521679 - Inspection method and inspection system using charged particle beam (2009-04-21),

9. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),

10. 7397031 - Method of inspecting a circuit pattern and inspecting instrument (2008-07-08),

11. 7394070 - Method and apparatus for inspecting patterns (2008-07-01),

12. 7375538 - Method of inspecting pattern and inspecting instrument (2008-05-20),

13. 7276693 - Inspection method and apparatus using charged particle beam (2007-10-02),

14. 7271385 - Inspection method and inspection apparatus using electron beam (2007-09-18),

15. 7260256 - Method and system for inspecting a pattern (2007-08-21),

Title: Mari Nozoe - Pioneering Female Inventor from Hino, Japan

Introduction: Mari Nozoe is a trailblazing inventor hailing from Hino, Japan, known for her groundbreaking contributions to the field of technology and innovation.

Latest Patents: Mari Nozoe holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing her versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Mari Nozoe has worked with top research institutions and universities in Japan, spearheading projects that have led to significant advancements in various industries.

Collaborations: Throughout her career, Mari Nozoe has collaborated with leading companies in Japan and internationally, fostering innovation and driving progress in the global tech landscape.

Conclusion: Mari Nozoe's dedication to innovation, coupled with her passion for creating a sustainable future through technology, solidifies her status as a pioneering female inventor in the world of inventions and patents.

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