Laurent Karsenti

Title: The Innovative Contributions of Laurent Karsenti

Introduction

Laurent Karsenti is a prominent inventor based in Rehovot, Israel. He has made significant contributions to the field of technology, particularly in the areas of optical imaging and machine learning for semiconductor applications. With a total of 11 patents to his name, Karsenti's work has had a substantial impact on the industry.

Latest Patents

Among his latest patents is a system for context-based defect inspection. This innovative system includes an optical imaging sub-system and one or more controllers that are communicatively coupled to the optical imaging system. The controllers are designed to receive reference images and test images of a sample, generating probabilistic context maps during inspection runtime using an unsupervised classifier. These maps are then provided to a supervised classifier to identify defects on the sample.

Another notable patent focuses on the accelerated training of a machine learning-based model for semiconductor applications. This method involves acquiring information for non-nominal instances of specimens and training the model with nominal instances. The model is then re-trained with non-nominal instances, allowing for effective transfer learning.

Career Highlights

Karsenti has worked with leading companies in the technology sector, including Kla Tencor Corporation and Applied Materials Israel Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in the field.

Collaborations

Throughout his career, Karsenti has collaborated with notable professionals such as Kris Bhaskar and Brian Duffy. These collaborations have further enriched his work and expanded the scope of his inventions.

Conclusion

Laurent Karsenti's contributions to technology through his patents and collaborations highlight his role as a leading inventor in the field. His innovative systems and methods continue to influence advancements in optical imaging and machine learning applications.