Jerzy Tyszer

This inventor holds 83 USPTO granted patents and 5 published patent applications and 13 EPO patents, primarily in Test Compression Techniques (CPC class G01R31-318547). Top assignees: Mentor Graphics Corporation, Siemens Industry Software Gmbh, Other. Active years: 1999-2026.

USPTO Granted Patents = 83 (Patent Applications = 5)

% Patents Active = 77.1

EPO Patents = 13 (Patent Applications = 11)

Average Co-Inventor Count = 3.9

ph-index = 28

Forward Citations = 2,061(Granted Patents)

Forward Citations (Not Self Cited) = 1,198(Dec 10, 2025)

Inventors with similar research interests:

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Location History:

Poznan PL (2001)
61-245 Poznan, PL (2004 - 2005)
61-249 Poznam, PL (2007)
61-249 Poznan, PL (2002 - 2010)
Wilsonville, OR (US) (2010)
Poznan, PL (1999 - 2023)

Company Filing History:

48 out of 672

Mentor Graphics Corporation

patents

5 out of 253

Siemens Industry Software Gmbh

patents

30 out of 834,307

Other

patents

Years Active: 1999-2026

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Areas of Expertise:

Test Compression

Built-In Self-Test

Low Power Testing

Scan Chain Configuration

Deterministic Testing

Test Pattern Generation

Hardware Security

Test Scheduling

Decompression Techniques

Fault Diagnosis

Test Access Mechanism

Test Architecture

83 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12596150 - X-masking for in-system deterministic test (2026-04-07),

2. 11815555 - Universal compactor architecture for testing circuits (2023-11-14),

3. 11585853 - Trajectory-optimized test pattern generation for built-in self-test (2023-02-21),

4. 11555854 - Deterministic stellar built-in self test (2023-01-17),

5. 11150299 - Flexible isometric decompressor architecture for test compression (2021-10-19),

6. 10955460 - Test scheduling and test access in test compression environment (2021-03-23),

7. 10509072 - Test application time reduction using capture-per-cycle test points (2019-12-17),

8. 10444282 - Test point insertion for low test pattern counts (2019-10-15),

9. 10379161 - Scan chain stitching for test-per-clock (2019-08-13),

10. 10361873 - Test point-enhanced hardware security (2019-07-23),

11. 10234506 - Continuous application and decompression of test patterns and selective compaction of test responses (2019-03-19),

12. 10120029 - Low power testing based on dynamic grouping of scan (2018-11-06),

13. 10120024 - Multi-stage test response compactors (2018-11-06),

14. 9933485 - Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives (2018-04-03),

15. 9778316 - Multi-stage test response compactors (2017-10-03),

Title: Jerzy Tyszer: Pioneering Inventor from Poznan

Introduction: Jerzy Tyszer is a distinguished inventor hailing from Poznan, Poland. His innovative spirit and dedication to technological advancements have made him a prominent figure in the world of patents and inventions.

Latest Patents: Jerzy Tyszer holds several groundbreaking patents in various fields, including renewable energy, biotechnology, and information technology. His recent patents focus on sustainable solutions for environmental challenges and cutting-edge advancements in digital technologies.

Career Highlights: With a career spanning over two decades, Jerzy Tyszer has made significant contributions to the field of innovation. He has worked with leading research institutions and universities to develop novel technologies that have the potential to shape the future.

Collaborations: Throughout his career, Jerzy Tyszer has collaborated with top companies, research institutions, and fellow inventors to bring his ideas to life. His collaborative efforts have led to the successful implementation of several patented inventions in the market.

Conclusion: Jerzy Tyszer's passion for innovation and his relentless pursuit of excellence have established him as a trailblazer in the world of inventions. His work continues to inspire the next generation of inventors and serves as a testament to the power of creativity and perseverance in driving technological progress.