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For the Inventor, By the Inventor

Jerzy Tyszer

Poznan, Poland

Jerzy Tyszer

LinkedIn
USPTO Granted Patents = 82 

 

Average Co-Inventor Count = 3.9

ph-index = 28

Forward Citations = 2,055(Granted Patents)


Inventors with similar research interests:


Location History:

  • Poznan PL (2001)
  • 61-245 Poznan, PL (2004 - 2005)
  • 61-249 Poznam, PL (2007)
  • 61-249 Poznan, PL (2002 - 2010)
  • Wilsonville, OR (US) (2010)
  • Poznan, PL (1999 - 2023)

Company Filing History:

goldMedal48 out of 672 
 
Mentor Graphics Corporation
 patents
silverMedal4 out of 208 
 
Siemens Industry Software Gmbh
 patents
bronzeMedal30 out of 832,680 
Other
 patents

Years Active: 1999-2023

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Areas of Expertise:
Test Compression
Built-In Self-Test
Scan Chain Configuration
Test Pattern Generation
Fault Diagnosis
Low Power Testing
On-Chip Comparison
Test Scheduling
Isometric Decompression
Selective Masking
Circuit Testing
Test Architecture
82 patents (USPTO):Explore Patents
1. 11815555 - Universal compactor architecture for testing circuits (2023-11-14),
2. 11585853 - Trajectory-optimized test pattern generation for built-in self-test (2023-02-21),
3. 11555854 - Deterministic stellar built-in self test (2023-01-17),
4. 11150299 - Flexible isometric decompressor architecture for test compression (2021-10-19),
5. 10955460 - Test scheduling and test access in test compression environment (2021-03-23),
6. 10509072 - Test application time reduction using capture-per-cycle test points (2019-12-17),
7. 10444282 - Test point insertion for low test pattern counts (2019-10-15),
8. 10379161 - Scan chain stitching for test-per-clock (2019-08-13),
9. 10361873 - Test point-enhanced hardware security (2019-07-23),
10. 10234506 - Continuous application and decompression of test patterns and selective compaction of test responses (2019-03-19),
11. 10120029 - Low power testing based on dynamic grouping of scan (2018-11-06),
12. 10120024 - Multi-stage test response compactors (2018-11-06),
13. 9933485 - Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives (2018-04-03),
14. 9778316 - Multi-stage test response compactors (2017-10-03),
15. 9720041 - Scan-based test architecture for interconnects in stacked designs (2017-08-01),

Title: Jerzy Tyszer: Pioneering Inventor from Poznan

Introduction: Jerzy Tyszer is a distinguished inventor hailing from Poznan, Poland. His innovative spirit and dedication to technological advancements have made him a prominent figure in the world of patents and inventions.

Latest Patents: Jerzy Tyszer holds several groundbreaking patents in various fields, including renewable energy, biotechnology, and information technology. His recent patents focus on sustainable solutions for environmental challenges and cutting-edge advancements in digital technologies.

Career Highlights: With a career spanning over two decades, Jerzy Tyszer has made significant contributions to the field of innovation. He has worked with leading research institutions and universities to develop novel technologies that have the potential to shape the future.

Collaborations: Throughout his career, Jerzy Tyszer has collaborated with top companies, research institutions, and fellow inventors to bring his ideas to life. His collaborative efforts have led to the successful implementation of several patented inventions in the market.

Conclusion: Jerzy Tyszer's passion for innovation and his relentless pursuit of excellence have established him as a trailblazer in the world of inventions. His work continues to inspire the next generation of inventors and serves as a testament to the power of creativity and perseverance in driving technological progress.

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