The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jan. 30, 2018
Applicant:
Mentor Graphics Corporation, Wilsonville, OR (US);
Inventors:
Janusz Rajski, West Linn, OR (US);
Sylwester Milewski, Lubawskie, PL;
Nilanjan Mukherjee, Wilsonville, OR (US);
Jedrzej Solecki, Poznan, PL;
Jerzy Tyszer, Poznan, PL;
Justyna Zawada, Paczkowo, PL;
Assignee:
Mentor Graphics Corporation, Wilsonville, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31724 (2013.01); G01R 31/31727 (2013.01); G01R 31/318538 (2013.01); G01R 31/318563 (2013.01); G01R 31/318547 (2013.01);
Abstract
Various aspects of the disclosed technology relate to using capture-per-cycle test points to reduce test application time. A scan-based testing system includes a plurality of regular scan chains and one or more capture-per-cycle scan chains on which scan cells capture and compact test responses at predetermined observation points per shift clock cycle.