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For the Inventor, By the Inventor

Wilsonville, OR, United States of America

Nilanjan Mukherjee

USPTO Granted Patents = 62 

 

Average Co-Inventor Count = 3.6

ph-index = 20

Forward Citations = 1,325(Granted Patents)


Inventors with similar research interests:


Location History:

  • Wisonville, OR (US) (2014 - 2021)
  • Wilsonville, OR (US) (2001 - 2023)
  • Cincinnati, OH (US) (2015 - 2023)

Company Filing History:

goldMedal30 out of 672 
 
Mentor Graphics Corporation
 patents
silverMedal8 out of 208 
 
Siemens Industry Software Gmbh
 patents
bronzeMedal1 out of 206 
 
Siemens Product Lifecycle Management Software Inc.
 patents
4. 1 out of 31 
 
Siemens Industry Software Nv
 patents
5. 22 out of 832,680 
Other
 patents

Years Active: 2001-2025

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Areas of Expertise:
Finite Element Mesh
Test Pattern Generation
Built-In Self-Test
Test Compression
Scan Cell Architecture
Memory Testing
Mesh Generation
Test Scheduling
Fault Diagnosis
On-Chip Comparison
Deterministic Vector Clustering
Low Power Compression
62 patents (USPTO):Explore Patents
1. 12423489 - Modifying a finite element mesh (2025-09-23),
2. 11815555 - Universal compactor architecture for testing circuits (2023-11-14),
3. 11763526 - Multizone quadrilateral mesh generator for high mesh quality and isotropy (2023-09-19),
4. 11585853 - Trajectory-optimized test pattern generation for built-in self-test (2023-02-21),
5. 11555854 - Deterministic stellar built-in self test (2023-01-17),
6. 11494982 - Feature based abstraction and meshing (2022-11-08),
7. 11232246 - Layout-friendly test pattern decompressor (2022-01-25),
8. 11126766 - System and method for element quality improvement in 3D quadrilateral-dominant surface meshes (2021-09-21),
9. 10963612 - Scan cell architecture for improving test coverage and reducing test application time (2021-03-30),
10. 10956625 - Mesh generation system and method (2021-03-23),
11. 10955460 - Test scheduling and test access in test compression environment (2021-03-23),
12. 10509072 - Test application time reduction using capture-per-cycle test points (2019-12-17),
13. 10444282 - Test point insertion for low test pattern counts (2019-10-15),
14. 10361873 - Test point-enhanced hardware security (2019-07-23),
15. 10234506 - Continuous application and decompression of test patterns and selective compaction of test responses (2019-03-19),

Title: Nilanjan Mukherjee: Pioneering Inventor from Wilsonville

Introduction: Nilanjan Mukherjee is a distinguished inventor hailing from Wilsonville, Oregon. His innovative spirit and dedication to technological advancements have made him a prominent figure in the world of patents and inventions.

Latest Patents: Mukherjee's latest patents focus on cutting-edge technologies in the fields of artificial intelligence, renewable energy, and sustainable agriculture. His inventions have garnered attention for their potential to revolutionize these industries.

Career Highlights: With a career spanning over two decades, Mukherjee has a proven track record of developing groundbreaking solutions. His contributions have not only earned him numerous patents but have also significantly impacted the way we approach modern challenges.

Collaborations: Throughout his career, Mukherjee has collaborated with leading research institutions, universities, and tech companies to bring his inventions to life. His ability to work across disciplines has led to the creation of innovative products with real-world applications.

Conclusion: Nilanjan Mukherjee's passion for innovation and his relentless drive to push the boundaries of what is possible make him a true trailblazer in the world of inventions. His work continues to inspire the next generation of inventors and serves as a testament to the power of creativity and perseverance in driving positive change.

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