The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Nov. 16, 2016
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Janusz Rajski, West Linn, OR (US);

Nilanjan Mukherjee, Wilsonville, OR (US);

Elham K. Moghaddam, Beaverton, OR (US);

Jerzy Tyszer, Poznan, PL;

Justyna Zawada, Paczkowo, PL;

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/26 (2006.01); G06F 11/00 (2006.01); G08B 13/00 (2006.01); G08B 21/00 (2006.01); G08B 29/00 (2006.01); H04L 9/32 (2006.01); G01R 31/317 (2006.01); H04L 9/06 (2006.01); G01R 31/3185 (2006.01); G06F 21/75 (2013.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G01R 31/31719 (2013.01); G01R 31/318588 (2013.01); G06F 21/75 (2013.01); H04L 9/0662 (2013.01); H04L 2209/12 (2013.01);
Abstract

Various aspects of the disclosed technology relate to techniques of using control test points to enhance hardware security. The design-for-security circuitry reuses control test points, a part of design-for-test circuitry. The design-for-security circuitry comprises: identity verification circuitry; scrambler circuitry coupled; and test point circuitry. The test point circuitry comprises scan cells and logic gates The identify verification circuitry outputs an identity verification result to the scrambler circuitry to enable/disable control test points of the test point circuitry through the logic gates, and the scrambler circuitry outputs logic bits for loading the scan cells to activate/inactivate the control test points through the logic gates.


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