Paczkowo, Poland

Justyna Zawada


Average Co-Inventor Count = 5.3

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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3 patents (USPTO):Explore Patents

Title: Justyna Zawada: Innovator in Test Application Technologies

Introduction

Justyna Zawada is a prominent inventor based in Paczkowo, Poland. She has made significant contributions to the field of test application technologies, holding a total of 3 patents. Her work focuses on enhancing the efficiency of testing systems, which is crucial in various technological applications.

Latest Patents

One of her latest patents is titled "Test application time reduction using capture-per-cycle test points." This innovation relates to utilizing capture-per-cycle test points to minimize test application time. The technology involves a scan-based testing system that includes multiple regular scan chains and one or more capture-per-cycle scan chains. These chains allow scan cells to capture and compact test responses at predetermined observation points per shift clock cycle.

Another notable patent is "Test point insertion for low test pattern counts." This invention addresses conflict-reducing test point insertion techniques. It determines locations in a circuit design for inserting test points based on internal signal conflicts that arise from detecting multiple faults with a single test pattern. The test points can include control points, observation points, or both, and may address horizontal and vertical conflicts.

Career Highlights

Justyna Zawada is currently employed at Mentor Graphics Corporation, where she continues to innovate in the field of testing technologies. Her work has been instrumental in advancing the efficiency and effectiveness of testing systems.

Collaborations

Throughout her career, Justyna has collaborated with notable professionals in her field, including Janusz Rajski and Nilanjan Mukherjee. These collaborations have further enriched her contributions to the industry.

Conclusion

Justyna Zawada is a remarkable inventor whose work in test application technologies has led to significant advancements in the field. Her patents reflect her commitment to innovation and efficiency, making her a valuable asset to Mentor Graphics Corporation and the broader technological community.

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