The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Mar. 16, 2011
Mark Kassab, Wilsonville, OR (US);
Grzegorz Mrugalski, Swarzedz, PL;
Nilanjan Mukherjee, Wisonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Jakub Janicki, Poznan, PL;
Jerzy Tyszer, Poznan, PL;
Mark Kassab, Wilsonville, OR (US);
Grzegorz Mrugalski, Swarzedz, PL;
Nilanjan Mukherjee, Wisonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Jakub Janicki, Poznan, PL;
Jerzy Tyszer, Poznan, PL;
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Disclosed are representative embodiments of methods, apparatus, and systems for test scheduling and test access in a test compression environment. Clusters of test patterns for testing a plurality of cores in a circuit are formed based on test information that includes compressed test data, corresponding tester channel requirements and correlated cores. The formation of test pattern clusters is followed by tester channel allocation. A best-fit scheme or a balanced-fit scheme may be employed to generate channel allocation information. A test access circuit for dynamic channel allocation can be designed based on the channel allocation information.