The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Mar. 21, 2019
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Janusz Rajski, West Linn, OR (US);

Yu Huang, West Linn, OR (US);

Sylwester Milewski, Nowe Miasto Lubawskie, PL;

Jerzy Tyszer, Poznan, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/31813 (2013.01); G01R 31/318536 (2013.01); G01R 31/318555 (2013.01);
Abstract

A system for testing a circuit comprises scan chains, a controller, and hold-toggle circuitry. The hold-toggle circuitry is configured to allow, according to a control signal generated by the controller, some scan chains in the scan chains to operate in a full-toggle mode and some other scan chains in the scan chains to operate in a hold-toggle mode when a test pattern is being shifted into the scan chains. The control signal also contains information of a hold-toggle pattern for the scan chains operating in the hold-toggle mode. The hold-toggle pattern repeats multiple times when the test pattern is being shifted into the scan chains.


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