The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Dec. 07, 2021
Applicant:

Siemens Industry Software Inc., Plano, TX (US);

Inventors:

Janusz Rajski, West Linn, OR (US);

Grzegorz Mrugalski, Swarzedz, PL;

Jerzy Tyszer, Poznan, PL;

Bartosz Wlodarczak, Swarzedz, PL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/318563 (2013.01);
Abstract

A circuit comprises: scan chains comprising scan cells, the scan chains configured to shift in test patterns, apply the test patterns to the circuit, capture test responses of the circuit, and shift out the test responses; a decompressor configured to decompress compressed test patterns into the test patterns; and a test response compactor configured to compact the test responses, the test response compactor comprising: first X-masking circuitry configured to mask, based on first masking information, some of X bits in the test responses, the first masking information remaining the same while a test response for each of the test patterns is being shifted out, the first masking information being different for at least two of the test patterns; and second masking circuitry configured to mask, based on second masking information, rest of the X bits in the test responses.


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