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For the Inventor, By the Inventor

Sunnyvale, CA, United States of America

Jen-Shiang Wang

This inventor holds 23 USPTO granted patents and 9 published patent applications and 2 EPO patents, primarily in Machine Learning Metrology. Top assignee: Asml Netherlands B.v.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jen-Shiang Wang. Retrieved from https://idiyas.com/inventor/jen-shiang-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 91.3

 

Average Co-Inventor Count = 4.8

ph-index = 3

Forward Citations = 47(Granted Patents)


Company Filing History:

goldMedal23 out of 5,080 
 
Asml Netherlands B.v.
 patents

Years Active: 2016-2026

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Areas of Expertise:
Process Models
Machine Learning
Metrology
Patterning Process
Etch Bias
Image Generation
Inspection
Substrate Measurement
Device Matching
Stochastic Variation
Target Design
Averaged SEM Images
23 patents (USPTO):Explore Patents
1. 12769213 - Methods for improving process based contour information of structure in image (2026-10-20),
2. 12717243 - Methods of determining process models by machine learning (2026-08-25),
3. 12529966 - Machine learning based image generation for model base alignments (2026-01-20),
4. 12505524 - Method for training or using a process model for determining a pattern in a patterning process (2025-12-23),
5. 12468232 - Etch bias characterization and method of using the same (2025-11-11),
6. 12204826 - Method and apparatus for inspection and metrology (2025-01-21),
7. 12182983 - Utilize machine learning in selecting high quality averaged SEM images from raw images automatically (2024-12-31),
8. 11977336 - Method for improving a process for a patterning process (2024-05-07),
9. 11875101 - Method for patterning process modelling (2024-01-16),
10. 11675274 - Etch bias characterization and method of using the same (2023-06-13),
11. 11614690 - Methods of tuning process models (2023-03-28),
12. 11580274 - Method and apparatus for inspection and metrology (2023-02-14),
13. 11567413 - Method for determining stochastic variation of printed patterns (2023-01-31),
14. 10983440 - Selection of substrate measurement recipes (2021-04-20),
15. 10948831 - Methods of determining process models by machine learning (2021-03-16),

Title: The Innovative Journey of Inventor Jen-Shiang Wang

Introduction: Jen-Shiang Wang, a talented inventor based in Sunnyvale, CA, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents: Wang's latest patents include cutting-edge technologies in the fields of artificial intelligence, renewable energy, and biotechnology, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Jen-Shiang Wang has established himself as a pioneer in the tech industry, holding numerous patents that have revolutionized various sectors. His dedication to innovation and problem-solving has earned him recognition as a leading figure in the field.

Collaborations: Wang has collaborated with top research institutions, universities, and tech companies to further his inventions and bring them to market successfully. His ability to work in multidisciplinary teams has led to the development of groundbreaking technologies that have had a lasting impact on society.

Conclusion: Jen-Shiang Wang's passion for innovation, coupled with his technical expertise, has solidified his position as a respected inventor in the technology landscape. His relentless pursuit of excellence and commitment to pushing the boundaries of what is possible continue to inspire future generations of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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