Los Altos Hills, CA, United States of America

Jack Jau

This inventor holds 53 USPTO granted patents and 3 published patent applications, primarily in Charged Particle Beam Inspection (CPC class H01J). Top assignees: Hermes Microvision Inc., Asml Netherlands B.v., Hermes Microvision, Inc. (Taiwan). Active years: 2004-2026.

USPTO Granted Patents = 53 (Patent Applications = 3)

% Patents Active = 81.1

Average Co-Inventor Count = 3.0

ph-index = 7

Forward Citations = 480(Granted Patents)

Forward Citations (Not Self Cited) = 453(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Los Altos, CA (US) (2004 - 2015)
Los Altos Hills, CA (US) (2011 - 2024)

Company Filing History:

43 out of 160

Hermes Microvision Inc.

patents

9 out of 5,062

Asml Netherlands B.v.

patents

1 out of 3

Hermes Microvision, Inc. (Taiwan)

patents

Years Active: 2004-2026

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Areas of Expertise:

Charged Particle Beam

Inspection Method

Defect Classification

Critical Dimension Measurement

Wafer Inspection

Optical Height Detection

Semiconductor Manufacturing

Image Filtering

E-beam System

Dynamic Focus Adjustment

Overlay Shift Defect

Substrate Edge Effect

53 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12620549 - Dynamic determination of a sample inspection recipe of charged particle beam inspection (2026-05-05),

2. 11880971 - Inspection method and system (2024-01-23),

3. 11430631 - Methods of inspecting samples with multiple beams of charged particles (2022-08-30),

4. 11250559 - Inspection method and system (2022-02-15),

5. 11217423 - Apparatus of plural charged-particle beams (2022-01-04),

6. 11043356 - Local alignment point calibration method in die inspection (2021-06-22),

7. 10679340 - Inspection method and system (2020-06-09),

8. 10586681 - Charged particle beam apparatus (2020-03-10),

9. 10497538 - Local alignment point calibration method in die inspection (2019-12-03),

10. 10380731 - Method and system for fast inspecting defects (2019-08-13),

11. 10236156 - Apparatus of plural charged-particle beams (2019-03-19),

12. 10102619 - Inspection method and system (2018-10-16),

13. 10020164 - Charged particle beam apparatus (2018-07-10),

14. 9965844 - Inspection method and system (2018-05-08),

15. 9953803 - Local alignment point calibration method in die inspection (2018-04-24),

Title: The Innovative Journey of Jack Jau

Introduction: Jack Jau, a visionary inventor based in Los Altos Hills, CA (US), has made significant contributions to the field of technology with his groundbreaking inventions.

Latest Patents: Jack Jau holds several patents in the realm of artificial intelligence and renewable energy technologies, showcasing his commitment to driving innovation forward.

Career Highlights: Throughout his illustrious career, Jack Jau has been at the forefront of cutting-edge research and development, leading to the creation of revolutionary products that have transformed industries.

Collaborations: Jack Jau has collaborated with top research institutions and leading tech companies to further his inventions, demonstrating his ability to work across disciplines to achieve remarkable results.

Conclusion: Jack Jau's passion for innovation and his relentless pursuit of excellence have solidified his position as a trailblazing inventor, inspiring the next generation of innovators to push the boundaries of what is possible in the world of technology.