The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Apr. 27, 2015
Applicant:
Hermes Microvision Inc., Hsinchu, TW;
Assignee:
HERMES MICROVISION INC., Hsinchu, TW;
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01); G06T 7/00 (2017.01); H01J 37/22 (2006.01); G01N 23/2251 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G01N 23/2251 (2013.01); H01J 37/222 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30148 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/2806 (2013.01);
Abstract
A method and system for inspecting defects saves scanned raw data as an original image so as to save time for repeated scanning and achieve faster defect inspection and lower false rate by reviewing suspicious defects and other regions of interest in the original image by using the same or different image-processing algorithm with the same or different parameters.