For the Inventor, By the Inventor

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Hsin-Chu, Taiwan

Hermes Microvision, Inc. (Taiwan)

USPTO Granted Patents = 3

Forward Citations = 104

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11 inventors (with patents filed for the assignee):

Wei Fang (1 out of 65 patents)

Xuedong Liu (1 out of 86 patents)

Zhongwei Chen (1 out of 90 patents)

4. Zhonghua Dong (1 out of 18 patents)

5. Zhong-wei Chen (1 out of 49 patents)

6. Jack Jau (1 out of 52 patents)

7. Chung-Shih Pan (1 out of 20 patents)

8. Yi Xiang Wang (1 out of 7 patents)

9. Chang-Chun (Roland) Yeh (1 out of 1 patent)

10. Anil A Desai (1 out of 5 patents)

11. Yan Zhao (1 out of 14 patents)

3 patents: Sort by Forward Citations

1. 7705298 - System and method to determine focus parameters during an electron beam inspection (2010-04-27),

2. 6815345 - Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturing (2004-11-09),

3. 6791095 - Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focus (2004-09-14),

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USPTO Data Jan 1 1976 - Jan 6 2026

3 Patents

#54 in Hsin-Chu

#3,200 in Taiwan

Hsin-Chu, Taiwan

Hermes Microvision, Inc. (Taiwan)

Forward Citations = 104

11 inventors:

Wei Fang (1 out of 65 patents)

Xuedong Liu (1 out of 86 patents)

Zhongwei Chen (1 out of 90 patents)

4. Zhonghua Dong (1 out of 18 patents)

5. Zhong-wei Chen (1 out of 49 patents)

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