Forward Citations = 105

Loading Chart...

11 inventors (with patents filed for the assignee):

Wei Fang (1 out of 73 patents)

Xuedong Liu (1 out of 88 patents)

Zhongwei Chen (1 out of 90 patents)

4. Zhonghua Dong (1 out of 19 patents)

5. Zhong-wei Chen (1 out of 50 patents)

6. Jack Jau (1 out of 53 patents)

7. Chung-Shih Pan (1 out of 20 patents)

8. Yi Xiang Wang (1 out of 7 patents)

9. Chang-Chun (Roland) Yeh (1 out of 1 patent)

10. Anil A Desai (1 out of 5 patents)

11. Yan Zhao (1 out of 14 patents)

3 patents: Sort by Forward Citations

1. 7705298 - System and method to determine focus parameters during an electron beam inspection (2010-04-27),

2. 6815345 - Method for in-line monitoring of via/contact holes etch process based on test structures in semiconductor wafer manufacturing (2004-11-09),

3. 6791095 - Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focus (2004-09-14),

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

3 Patents

#458 in Hsinchu

#3,314 in Taiwan

Hsinchu, Taiwan

Hermes Microvision, Inc. (Taiwan)

Forward Citations = 105

11 inventors:

Wei Fang (1 out of 73 patents)

Xuedong Liu (1 out of 88 patents)

Zhongwei Chen (1 out of 90 patents)

4. Zhonghua Dong (1 out of 19 patents)

5. Zhong-wei Chen (1 out of 50 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hermes Microvision, Inc. (Taiwan). Retrieved from https://idiyas.com/company/hermes-microvision-taiwan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]