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For the Inventor, By the Inventor

Palo Alto, CA, United States of America

Chung-Shih Pan

USPTO Granted Patents = 20

Average Co-Inventor Count = 3.2

ph-index = 5

Forward Citations = 207(Granted Patents)


Location History:

  • Palto Alto, CA (US) (2010)
  • Palo Alto, CA (US) (1996 - 2018)
  • San Jose, CA (US) (2016 - 2023)

Company Filing History:

goldMedal16 out of 160 
 
Hermes Microvision Inc.
 patents
silverMedal2 out of 4,883 
 
Asml Netherlands B.v.
 patents
bronzeMedal1 out of 46 
 
Kla Instruments Corporation
 patents
4. 1 out of 3 
 
Hermes Microvision, Inc. (taiwan)
 patents

Years Active: 1996-2023

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20 patents (USPTO):
1. 11662323 - Method and system for inspecting an EUV mask (2023-05-30),
2. 10775325 - Method and system for inspecting an EUV mask (2020-09-15),
3. 10088438 - Method and system for inspecting an EUV mask (2018-10-02),
4. 10054556 - Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask (2018-08-21),
5. 9859089 - Method and system for inspecting and grounding an EUV mask (2018-01-02),
6. 9572237 - Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask (2017-02-14),
7. 9485846 - Method and system for inspecting an EUV mask (2016-11-01),
8. 9460887 - Discharging method for charged particle beam imaging (2016-10-04),
9. 9164399 - Reticle operation system (2015-10-20),
10. 9113538 - Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask (2015-08-18),
11. 8604428 - Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system (2013-12-10),
12. 8575573 - Structure for discharging extreme ultraviolet mask (2013-11-05),
13. 8519333 - Charged particle system for reticle/wafer defects inspection and review (2013-08-27),
14. 8110818 - Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system (2012-02-07),
15. 8094924 - E-beam defect review system (2012-01-10),

Title: The Innovative Journey of Inventor Chung-Shih Pan

Introduction: Chung-Shih Pan, a talented inventor based in Palo Alto, CA, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents: Chung-Shih Pan holds several patents in various technological areas, including artificial intelligence, renewable energy, and medical devices. His most recent patents focus on enhancing user experience in mobile applications and improving data security in cloud computing.

Career Highlights: With a background in computer science and engineering, Chung-Shih Pan has had a distinguished career marked by his ability to translate complex technological concepts into practical solutions. He has worked for leading tech companies, where he spearheaded research and development projects that have led to the creation of cutting-edge products.

Collaborations: Chung-Shih Pan is known for his collaborative spirit, having partnered with top researchers, engineers, and designers to bring his inventions to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of many projects.

Conclusion: In conclusion, Chung-Shih Pan's innovative spirit and dedication to pushing the boundaries of technology have established him as a respected figure in the world of inventions. His passion for creating solutions that improve people's lives continues to drive his work forward, inspiring the next generation of inventors and innovators.

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