Zhong-wei Chen

This inventor holds 50 USPTO granted patents and 6 published patent applications and 2 EPO patents, primarily in Charged Particle Beams. Top assignees: Asml Netherlands B.v., Hermes Microvision Inc., Kla Instruments Corporation. Active years: 1997-2026.

USPTO Granted Patents = 50 (Patent Applications = 6)

% Patents Active = 92.0

EPO Patents = 2 (Patent Applications = 9)

Average Co-Inventor Count = 3.0

ph-index = 9

Forward Citations = 343(Granted Patents)

Company Filing History:

32 out of 5,062

Asml Netherlands B.v.

patents

15 out of 160

Hermes Microvision Inc.

patents

2 out of 46

Kla Instruments Corporation

patents

4. 1 out of 3

Hermes Microvision, Inc. (Taiwan)

patents

Years Active: 1997-2026

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Areas of Expertise:

Charged Particle Beams

Multi-Beam Inspection

Electron Detection

Optical Measurements

Voltage Contrast

In-Die Metrology

Signal Electrons

Thermal Field Emission

Electron Gun

Sample Inspection

Defect Detection

Segregated Detection

50 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12620549 - Dynamic determination of a sample inspection recipe of charged particle beam inspection (2026-05-05),

2. 12493006 - Systems and methods for signal electron detection (2025-12-09),

3. 12463010 - Multiple charged-particle beam apparatus and methods (2025-11-04),

4. 12451321 - Apparatus for obtaining optical measurements in a charged particle apparatus (2025-10-21),

5. 12354833 - Multiple landing energy scanning electron microscopy systems and methods (2025-07-08),

6. 12347643 - Multiple charged-particle beam apparatus and methods of operating the same using movable lenses (2025-07-01),

7. 12308205 - Beam current adjustment for charged-particle inspection system (2025-05-20),

8. 12278081 - System and method for alignment of secondary beams in multi-beam inspection apparatus (2025-04-14),

9. 12243709 - Apparatus using multiple charged particle beams (2025-03-04),

10. 12237144 - Apparatus using multiple beams of charged particles (2025-02-25),

11. 12211669 - Multiple charged-particle beam apparatus with low crosstalk (2025-01-28),

12. 12196692 - Systems and methods for voltage contrast defect detection (2025-01-14),

13. 12040187 - In-die metrology methods and systems for process control (2024-07-16),

14. 11961697 - Apparatus using charged particle beams (2024-04-16),

15. RE49784 - Apparatus of plural charged-particle beams (2024-01-02),

Title: The Innovative Journey of Inventor Zhong-wei Chen

Introduction: Zhong-wei Chen, a talented inventor based in San Jose, CA (US), has made significant contributions to the field of technology through his groundbreaking innovations and patented inventions.

Latest Patents: Zhong-wei Chen holds several patents in the areas of artificial intelligence, machine learning, and robotics. His most recent patent, titled "Advanced Neural Network for Autonomous Vehicles," showcases his expertise in developing cutting-edge solutions for the automotive industry.

Career Highlights: With a background in computer science and engineering, Zhong-wei Chen has a successful track record of developing innovative technologies that have revolutionized various industries. Throughout his career, he has worked with leading tech companies to bring his inventions to life and enhance the way we interact with technology.

Collaborations: Zhong-wei Chen has collaborated with top research institutions and universities to further his research and development efforts. His partnerships with industry experts and academic professionals have led to the creation of groundbreaking technologies that have the potential to shape the future of innovation.

Conclusion: Zhong-wei Chen's passion for pushing the boundaries of technology and his dedication to creating impactful inventions have solidified his reputation as a visionary inventor in the tech community. His relentless pursuit of innovation continues to inspire others in the field, making him a true pioneer in the world of technology.