The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Apr. 01, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Weiming Ren, San Jose, CA (US);

Zhong-Wei Chen, Los Altos, CA (US);

Yongxin Wang, San Ramon, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2251 (2018.01); H01J 37/244 (2006.01); H10F 30/295 (2025.01); H10F 71/00 (2025.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); H01J 37/244 (2013.01); H10F 30/295 (2025.01); H10F 71/121 (2025.01); G01N 2223/07 (2013.01); G01N 2223/313 (2013.01); G01N 2223/507 (2013.01); H01J 2237/057 (2013.01); H01J 2237/2441 (2013.01); H01J 2237/24475 (2013.01);
Abstract

Some disclosed embodiments include an electron detector comprising: a first semiconductor layer having a first portion and a second portion; a second semiconductor layer; a third semiconductor layer; a PIN region formed by the first, second, and third semiconductor layers; a power supply configured to apply a reverse bias between the first and the third semiconductor layers; and a depletion region formed within the PIN region by the reverse bias and configured to generate a detector signal based on a first subset of the plurality of signal electrons captured within the depletion region, wherein the second portion of the first semiconductor layer is not depleted and is configured to provide an energy barrier to block a second subset of the plurality of signal electrons and to allow the first subset of the plurality of signal electrons to pass through to reach the depletion region.


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