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For the Inventor, By the Inventor

Saitama, Japan

Hiroyasu Nakayama

This inventor holds 15 USPTO granted patents and 1 published patent application. Top assignee: Adv Antest Corporation. Active years: 1999-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyasu Nakayama. Retrieved from https://idiyas.com/inventor/hiroyasu-nakayama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 53.3

Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 37(Granted Patents)


Location History:

  • Kumagayashi, JP (1999)
  • Kumagaya, JP (2000)
  • Tokyo, JP (2003 - 2008)
  • Saitama, JP (2011 - 2014)

Company Filing History:

goldMedal15 out of 2,281 
 
Adv Antest Corporation
 patents

Years Active: 1999-2014

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15 patents (USPTO):Explore Patents
1. 8743702 - Test apparatus and test method (2014-06-03),
2. 8692566 - Test apparatus and test method (2014-04-08),
3. 8666691 - Test apparatus and test method (2014-03-04),
4. 8483073 - Test apparatus and test method (2013-07-09),
5. 8362791 - Test apparatus additional module and test method (2013-01-29),
6. 8165027 - Test apparatus and test method (2012-04-24),
7. 8149721 - Test apparatus and test method (2012-04-03),
8. 8059547 - Test apparatus and test method (2011-11-15),
9. 7472327 - Pattern generator and test apparatus (2008-12-30),
10. 7235995 - Test apparatus and testing method (2007-06-26),
11. 7015685 - Semiconductor tester (2006-03-21),
12. 6604058 - Semiconductor device testing apparatus and method for testing semiconductor device (2003-08-05),
13. 6587983 - Apparatus and method of testing a semiconductor device (2003-07-01),
14. 6058486 - Timing generator for plural reference clock frequencies (2000-05-02),
15. 5903745 - Timing generator for plural reference clocks (1999-05-11),

Title: Hiroyasu Nakayama: Innovator in Testing Apparatus Technology

Introduction

Hiroyasu Nakayama is a prominent inventor based in Saitama, Japan. He has made significant contributions to the field of testing apparatus technology, holding a total of 15 patents. His innovative work has paved the way for advancements in device testing methodologies.

Latest Patents

Among his latest patents, Nakayama has developed a test apparatus and test method that includes a plurality of channels for outputting and receiving signals to and from a device under test. This apparatus features a generating section that creates a packet data sequence for transmission, along with a channel selecting section that determines which channel is utilized for this process. Another notable patent involves a test apparatus comprising multiple testing sections and a synchronizing section. This design allows for the synchronization of operations among various testing sections, enhancing the efficiency of the testing process.

Career Highlights

Hiroyasu Nakayama has built a successful career at Adv Antest Corporation, where he has been instrumental in developing innovative testing solutions. His expertise in creating advanced testing apparatus has established him as a key figure in the industry.

Collaborations

Throughout his career, Nakayama has collaborated with talented individuals such as Masaru Tsuto and Masaru Goishi. These partnerships have contributed to the development of cutting-edge technologies in the field of testing apparatus.

Conclusion

Hiroyasu Nakayama's contributions to testing apparatus technology are noteworthy, with a solid portfolio of patents that reflect his innovative spirit. His work continues to influence the industry and drive advancements in device testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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