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For the Inventor, By the Inventor

Saitama, Japan

Hiroyasu Nakayama

USPTO Granted Patents = 15 

Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 37(Granted Patents)


Location History:

  • Kumagayashi, JP (1999)
  • Kumagaya, JP (2000)
  • Tokyo, JP (2003 - 2008)
  • Saitama, JP (2011 - 2014)

Company Filing History:

goldMedal15 out of 2,253 
 
Adv Antest Corporation
 patents

Years Active: 1999-2014

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15 patents (USPTO):Explore Patents
1. 8743702 - Test apparatus and test method (2014-06-03),
2. 8692566 - Test apparatus and test method (2014-04-08),
3. 8666691 - Test apparatus and test method (2014-03-04),
4. 8483073 - Test apparatus and test method (2013-07-09),
5. 8362791 - Test apparatus additional module and test method (2013-01-29),
6. 8165027 - Test apparatus and test method (2012-04-24),
7. 8149721 - Test apparatus and test method (2012-04-03),
8. 8059547 - Test apparatus and test method (2011-11-15),
9. 7472327 - Pattern generator and test apparatus (2008-12-30),
10. 7235995 - Test apparatus and testing method (2007-06-26),
11. 7015685 - Semiconductor tester (2006-03-21),
12. 6604058 - Semiconductor device testing apparatus and method for testing semiconductor device (2003-08-05),
13. 6587983 - Apparatus and method of testing a semiconductor device (2003-07-01),
14. 6058486 - Timing generator for plural reference clock frequencies (2000-05-02),
15. 5903745 - Timing generator for plural reference clocks (1999-05-11),
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