The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Dec. 07, 2010
Applicants:
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Inventors:
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 12/26 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test apparatus that tests a device under test, comprising: a plurality of channels that output and receive signals to and from the device under test; a generating section that generates a packet data sequence transmitted to and from the device under test; and a channel selecting section that selects which of the channels is used to transmit the packet data sequence generated by the generating section.