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Masaru Tsuto

USPTO Granted Patents = 18 (Patent Applications = 1)

Average Co-Inventor Count = 1.6

ph-index = 5

Forward Citations = 99(Granted Patents)

Location History:

Gyoda, JP (2000)
Saitama, JP (1998 - 2014)
Tokyo, JP (2002 - 2016)

Company Filing History:

18 out of 2,253

Adv Antest Corporation

Years Active: 1998-2016

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18 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9262376 - Test apparatus and test method (2016-02-16),

2. 8743702 - Test apparatus and test method (2014-06-03),

3. 8692566 - Test apparatus and test method (2014-04-08),

4. 8666691 - Test apparatus and test method (2014-03-04),

5. 8483073 - Test apparatus and test method (2013-07-09),

6. 8362791 - Test apparatus additional module and test method (2013-01-29),

7. 8165027 - Test apparatus and test method (2012-04-24),

8. 8149721 - Test apparatus and test method (2012-04-03),

9. 8059547 - Test apparatus and test method (2011-11-15),

10. 6769083 - Test pattern generator, a testing device, and a method of generating a plurality of test patterns (2004-07-27),

11. 6678852 - Semiconductor device testing apparatus (2004-01-13),

12. 6601204 - Pattern generating method, pattern generator using the method, and memory tester using the pattern generator (2003-07-29),

13. 6499126 - Pattern generator and electric part testing apparatus (2002-12-24),

14. 6484282 - Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns (2002-11-19),

15. 6363022 - Semiconductor memory device tester (2002-03-26),

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