The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
May. 31, 2011
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus comprising a plurality of testing sections and a synchronizing section that synchronizes operation of at least two testing sections among the plurality of testing sections. Each testing section transmits a synchronization standby command to the synchronizing section when a predetermined condition is fulfilled during execution of the corresponding program and the testing section enters a synchronization standby state, and on a condition that the synchronization standby commands have been received from all of one or more predetermined testing sections among the plurality of testing sections, the synchronizing section supplies a synchronization signal, which ends the synchronization standby state, in synchronization to two or more predetermined testing sections among the plurality of testing sections.