The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
May. 30, 2011
Shinichi Ishikawa, Saitama, JP;
Tetsu Katagiri, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Shinichi Ishikawa, Saitama, JP;
Tetsu Katagiri, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a testing section that stores a program in which commands to be executed branch according to detected branching conditions and that tests the device under test by executing the program; and a log memory that stores test results of the testing section in association with command paths of the program executed to obtain the test results. The testing section sequentially changes a characteristic of a test signal supplied to the device under test, and judges pass/fail of the device under test for each characteristic of the test signal, and the log memory stores a test result of the testing section in association with a command path of the program, for each characteristic of the test signal.