The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Dec. 08, 2008
Applicants:
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G06F 11/00 (2006.01); G08C 15/00 (2006.01); H04J 1/16 (2006.01); H04J 1/14 (2006.01); H04L 1/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets; and a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.