The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2012

Filed:

Sep. 29, 2009
Applicants:

Shinichi Ishikawa, Saitama, JP;

Masaru Goishi, Saitama, JP;

Hiroyasu Nakayama, Saitama, JP;

Masaru Tsuto, Saitama, JP;

Inventors:

Shinichi Ishikawa, Saitama, JP;

Masaru Goishi, Saitama, JP;

Hiroyasu Nakayama, Saitama, JP;

Masaru Tsuto, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 1/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow control section that designates an order of executing the plurality of packet lists in accordance with an execution flow of a test program that is designed to test the at least one device under test, and a packet communicating section that sequentially communicates the series of packets included in packet lists sequentially designated by the flow control section between the test apparatus and the at least one device under test, to test the at least one device under test.


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