The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Sep. 29, 2009
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Shinichi Ishikawa, Saitama, JP;
Masaru Goishi, Saitama, JP;
Hiroyasu Nakayama, Saitama, JP;
Masaru Tsuto, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a test apparatus for testing a device under test, including a receiving section that receives a packet from the device under test, a packet data sequence storing section that stores a data sequence included in each type of packet and received data included in the packet received by the receiving section, a transmission data processing section that reads data from the packet data sequence storing section and generates a test data sequence by adjusting a predetermined portion of a data sequence of a packet to be transmitted to the device under test to have a value corresponding to the received data, and a transmitting section that transmits the test data sequence generated by the transmission data processing section to the device under test.