Adv Antest Corporation

Hiroyasu Nakayama

Masaru Tsuto

Masaru Goishi

Shinichi Ishikawa

Masayuki Itoh

Satoshi Iwamoto

Hajime Sugimura

Tomoyuki Sugaya

Tetsu Katagiri

Motoo Ueda

Provided is a test apparatus that tests a device under test, comprising: a plurality of channels that output and receive signals to and from the device under test; a generating section that generates a packet data sequence transmitted to and from the device under test; and a channel selecting section that selects which of the channels is used to transmit the packet data sequence generated by the generating section.

Test apparatus and test method

Provided is a test apparatus comprising a plurality of testing sections and a synchronizing section that synchronizes operation of at least two testing sections among the plurality of testing sections. Each testing section transmits a synchronization standby command to the synchronizing section when a predetermined condition is fulfilled during execution of the corresponding program and the testing section enters a synchronization standby state, and on a condition that the synchronization standby commands have been received from all of one or more predetermined testing sections among the plurality of testing sections, the synchronizing section supplies a synchronization signal, which ends the synchronization standby state, in synchronization to two or more predetermined testing sections among the plurality of testing sections.

Provided is a test apparatus that tests a device under test, comprising a testing section that stores a program in which commands to be executed branch according to detected branching conditions and that tests the device under test by executing the program; and a log memory that stores test results of the testing section in association with command paths of the program executed to obtain the test results. The testing section sequentially changes a characteristic of a test signal supplied to the device under test, and judges pass/fail of the device under test for each characteristic of the test signal, and the log memory stores a test result of the testing section in association with a command path of the program, for each characteristic of the test signal.

There is provided a test apparatus for testing a device under test, including a receiving section that receives a packet from the device under test, a packet data sequence storing section that stores a data sequence included in each type of packet and received data included in the packet received by the receiving section, a transmission data processing section that reads data from the packet data sequence storing section and generates a test data sequence by adjusting a predetermined portion of a data sequence of a packet to be transmitted to the device under test to have a value corresponding to the received data, and a transmitting section that transmits the test data sequence generated by the transmission data processing section to the device under test.

A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.

Test apparatus additional module and test method

There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow control section that designates an order of executing the plurality of packet lists in accordance with an execution flow of a test program that is designed to test the at least one device under test, and a packet communicating section that sequentially communicates the series of packets included in packet lists sequentially designated by the flow control section between the test apparatus and the at least one device under test, to test the at least one device under test.

There is provided a test apparatus for testing a device under test, including an obtaining section that obtains a packet sequence communicated between the test apparatus and the device under test, from a simulation environment for simulating an operation of the device under test, a packet communication program generating section that generates from the packet sequence a packet communication program for a test, where the packet communication program is to be executed by the test apparatus to communicate packets included in the packet sequence between the test apparatus and the device under test, and a testing section that executes the packet communication program to test the device under test by communicating the packets between the test apparatus and the device under test.

Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets; and a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.

A pattern generator includes a main memory for storing a plurality of sequence data blocks for generating a test pattern, a first sequence cache memory for sequentially storing the sequence data blocks, a second sequence cache memory, a data development section for sequentially executing the sequence data blocks stored in the first cache memory and generating a test pattern and a read-ahead means, when the data development section detects a read-ahead instruction on reading ahead the other sequence blocks during executing one sequence data block, for reading the other sequence blocks from the main memory and storing the same in the second sequence cache memory.

Pattern generator and test apparatus

A test apparatus that tests a device under test, including a main memory having an expectation pattern storing region storing an expectation pattern sequence to be sequentially compared with output patterns sequentially output from a terminal of the device; a test pattern outputting unit for sequentially inputting a plurality of test patterns into the device; a capture unit for sequentially acquiring the output patterns into an output pattern storing region on the main memory; a memory reading unit for reading an output pattern sequence consisting of the plurality of acquired output patterns and the expectation pattern sequence from the main memory when the acquisition process acquiring the output patterns into the output pattern storing region has been terminated; and an expectation comparing unit for comparing the read expectation pattern sequence and the output pattern sequence.

Test apparatus and testing method

A semiconductor tester for testing a semiconductor device by generating pulses of different repetition periods to a DUT having ports of different periods (frequencies) without using plural timing memories holding timing sets. The semiconductor tester required to generate a timing edge pulse of a period M different from a test period N of the semiconductor tester comprises period converting means capable of generating a timing edge pulse of the period M different from the period N of the test rate without using timing set that the semiconductor tester has.

Semiconductor tester

A test signal supplying apparatus for a semiconductor device testing apparatus that tests a plurality of semiconductor devices; including: a test pattern generating unit for outputting an input signal pattern to the semiconductor devices and receiving a match signal which indicates the semiconductor device, to which the input signal pattern is applied, is passed in the test; and a match-fail detecting unit for receiving the match signal to detect a semiconductor device that fails in the test and outputting a match-fail signal for identifying the semiconductor device that fails in the test; and a stop signal output unit connected to the match-fail detecting unit for receiving the match-fail signal from the match-fail detecting unit, storing the match-fail signal, and outputting a first stop signal that stops an application of the input signal pattern to the semiconductor devices that fail in the test identified by the stored match-fail signal.

Semiconductor device testing apparatus and method for testing semiconductor device

Semiconductor device testing apparatus and method for testing a semiconductor device, includes: a pattern generator ( ) which, based on a predetermined control sequence, generates an input signal pattern ( ) and an expectation data signal pattern ( ); a comparison unit ( ) which compares an output signal pattern output from the semiconductor device and the expectation data signal pattern, and outputs a match signal when the output signal is matched with predetermined data determined based on the expectation data signal pattern. The pattern generator ( ) includes: a stoppage unit which stops the control sequence when the match signal does not become active during a predetermined match cycle; a resuming address register which sets up a resuming address indicating a resuming position of the control sequence; and a resuming unit which resumes the control sequence based on the resuming address.

Apparatus and method of testing a semiconductor device

A timing generator generates the same timing signals even when the frequency of a reference clock is changed. The timing generator includes a data memory for storing the timing data formed of quotient data and fractional data, a counter for counting the number of reference clock pulses and producing a delay time expressed by the quotient data, an accumulator for accumulating the fractional data and generating a carry signal when the accumulated value exceeds the reference clock period where the carry signal is provided to a cycle delay circuit for delaying an output of the counter by one cycle, a number converter for converting the timing data based on a ratio of first and second reference clocks, and a complementary number for compensating a time difference between the first and second reference clock periods.

Timing generator for plural reference clock frequencies

A timing generator compensates the difference between the reference clock frequencies by converting the base number for generating the timing signals corresponding to the ratio of reference clock frequencies. The timing generator includes: a data memory for dynamically receiving the timing data through the software process to determine the time length of the timing signals where the timing data is formed of a quotient produced by a division of the time length by a time period of a reference clock and a fraction which is a remainder of said division; a counter for counting the number of pulses of a reference clock signal and generating an output signal when the number of counts of the pulse coincides with the quotient; an accumulator for accumulating the fraction data with the fraction data of previous cycle of the reference clock signal and generating a carry signal when the accumulated value exceeds the time period of the reference clock signal; a number converter which converts the timing data provided through the software process based on a first reference clock period Tn by a ratio of the first reference clock period Tn and a second clock period Tm; and means for providing a complementary number -Tm of the second reference clock period Tm to the accumulator.

Growing community of inventors

Saitama, Japan

Hiroyasu Nakayama