The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Apr. 03, 2000
Hiroyasu Nakayama, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Semiconductor device testing apparatus and method for testing a semiconductor device, includes: a pattern generator ( ) which, based on a predetermined control sequence, generates an input signal pattern ( ) and an expectation data signal pattern ( ); a comparison unit ( ) which compares an output signal pattern output from the semiconductor device and the expectation data signal pattern, and outputs a match signal when the output signal is matched with predetermined data determined based on the expectation data signal pattern. The pattern generator ( ) includes: a stoppage unit which stops the control sequence when the match signal does not become active during a predetermined match cycle; a resuming address register which sets up a resuming address indicating a resuming position of the control sequence; and a resuming unit which resumes the control sequence based on the resuming address.