The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Apr. 27, 2001
Hiroyasu Nakayama, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A test signal supplying apparatus for a semiconductor device testing apparatus that tests a plurality of semiconductor devices; including: a test pattern generating unit for outputting an input signal pattern to the semiconductor devices and receiving a match signal which indicates the semiconductor device, to which the input signal pattern is applied, is passed in the test; and a match-fail detecting unit for receiving the match signal to detect a semiconductor device that fails in the test and outputting a match-fail signal for identifying the semiconductor device that fails in the test; and a stop signal output unit connected to the match-fail detecting unit for receiving the match-fail signal from the match-fail detecting unit, storing the match-fail signal, and outputting a first stop signal that stops an application of the input signal pattern to the semiconductor devices that fail in the test identified by the stored match-fail signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile