Hideaki Sasazawa

USPTO Granted Patents = 23 (Patent Applications = 1)

Average Co-Inventor Count = 3.9

ph-index = 7

Forward Citations = 119(Granted Patents)

Location History:

Kamisato, JP (2013)
Yokohama, JP (1998 - 2014)
Tokyo, JP (2019)

Company Filing History:

11 out of 2,874

Hitachi-high-technologies Corporation

Renesas Technology Corp.

patents

4. 1 out of 75

Hitachi Via Mechanics Ltd.

patents

5. 1 out of 2

Hitachi High-technologies Corporaiton

patents

Years Active: 1998-2019

where 'Filed Patents' based on already Granted Patents

23 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 10352879 - X-ray inspection method and device (2019-07-16),

2. 8736830 - Pattern inspection device of substrate surface and pattern inspection method of the same (2014-05-27),

3. 8638430 - Method for defect determination in fine concave-convex pattern and method for defect determination on patterned medium (2014-01-28),

4. 8547545 - Method and apparatus for inspecting a surface of a substrate (2013-10-01),

5. 8411928 - Scatterometry method and device for inspecting patterned medium (2013-04-02),

6. 8359661 - Magnetic device inspection apparatus and magnetic device inspection method (2013-01-22),

7. 8279431 - Spectral detection method and device, and defect inspection method and apparatus using the same (2012-10-02),

8. 8260029 - Pattern shape inspection method and apparatus thereof (2012-09-04),

9. 8253935 - Disk surface inspection apparatus, inspection system thereof, and inspection method thereof (2012-08-28),

10. 8040772 - Method and apparatus for inspecting a pattern shape (2011-10-18),

11. 7969567 - Method and device for detecting shape of surface of medium (2011-06-28),

12. 7898652 - Method and apparatus for detecting defects on a disk surface (2011-03-01),

13. 7816062 - Method and apparatus for semiconductor device production process monitoring and method and apparatus for estimating cross sectional shape of a pattern (2010-10-19),

14. 7449689 - Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the method (2008-11-11),

15. 7355143 - Circuit board production method and its apparatus (2008-04-08),

Title: A Comprehensive Overview of Hideaki Sasazawa's Innovative Contributions

Introduction

Hideaki Sasazawa is a notable innovator based in Yokohama, Japan. With an impressive portfolio of 23 patents, Sasazawa has made significant contributions to the field of semiconductor technology. His work has led to advancements in inspection methods that enhance the quality and efficiency of semiconductor manufacturing.

Latest Patents

Sasazawa's latest patents include groundbreaking technologies such as an X-ray inspection method and device. This method involves inspecting internal defects in through-silicon vias (TSVs) formed in semiconductor wafers. By utilizing X-ray transmission images, it enables the detection of X-rays with precision by determining the detection azimuth and elevation angle based on the structural characteristics of the sample. Furthermore, he has developed a pattern inspection device for substrate surfaces, capable of inspecting patterns smaller than the light resolution limit at high speeds. This device combines a near-field optical head and a detection system to analyze fine patterns, showcasing Sasazawa's innovative approach to semiconductor inspection.

Career Highlights

Throughout his career, Hideaki Sasazawa has been affiliated with esteemed corporations such as Hitachi High-Technologies Corporation and Hitachi, Ltd. These associations have allowed him to work at the forefront of technological advancements in the semiconductor industry, enabling him to garner numerous patents that reflect his ingenuity.

Collaborations

Sasazawa's endeavors have been enriched through collaborations with talented professionals, including Minoru Yoshida and Takenori Hirose. These partnerships have facilitated the exchange of ideas and expertise, further fueling the innovative processes that have culminated in Sasazawa's successful patent applications.

Conclusion

In summary, Hideaki Sasazawa stands out as a prominent inventor whose contributions to semiconductor technology have had a lasting impact. His latest patents showcase intricate methods and devices that push the boundaries of what is possible in semiconductor inspection. With a strong foundation in his career and fruitful collaborations, Sasazawa continues to be an influential figure in the realm of innovations and inventions.

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

1 patent pending:

Please report any incorrect information to support@idiyas.com

Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.