The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Dec. 30, 2009
Takehiro Tachizaki, Yokohama, JP;
Masahiro Watanabe, Yokohama, JP;
Hideaki Sasazawa, Yokohama, JP;
Minoru Yoshida, Yokohama, JP;
Tsuneo Nakagomi, Nakai, JP;
Teruaki Tokutomi, Odawara, JP;
Takehiro Tachizaki, Yokohama, JP;
Masahiro Watanabe, Yokohama, JP;
Hideaki Sasazawa, Yokohama, JP;
Minoru Yoshida, Yokohama, JP;
Tsuneo Nakagomi, Nakai, JP;
Teruaki Tokutomi, Odawara, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Applying an alternating current to a magnetic head as a sample generates an alternate-current magnetic field from the sample. A cantilever includes a probe that is made of a magnetic material or is coated with a magnetic material. The cantilever is displaced when it approaches the sample. Detecting the displacement of the cantilever detects distribution of the magnetic field from the sample. It is possible to fast measure distribution of the magnetic field generated from the sample when a frequency of the alternating current applied to the sample differs from a resonance frequency of the cantilever.