Takehiro Tachizaki

USPTO Granted Patents = 11 (Patent Applications = 1)

Average Co-Inventor Count = 4.5

ph-index = 2

Forward Citations = 14(Granted Patents)

Location History:

Tokyo, JP (2015)
Yokohama, JP (2013 - 2019)

Company Filing History:

7 out of 2,874

Hitachi-high-technologies Corporation

Years Active: 2013-2019

where 'Filed Patents' based on already Granted Patents

11 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 10267745 - Defect detection method and defect detection device and defect observation device provided with same (2019-04-23),

2. 9759666 - Defect detection method and defect detection device and defect observation device provided with same (2017-09-12),

3. 9217718 - Defect detection method and defect detection device and defect observation device provided with same (2015-12-22),

4. 9134279 - Internal defect inspection method and apparatus for the same (2015-09-15),

5. 9063168 - Scanning probe microscope and measurement method using same (2015-06-23),

6. 8982332 - Distance measuring device and distance measuring method (2015-03-17),

7. 8953156 - Defect detection method and defect detection device and defect observation device provided with same (2015-02-10),

8. 8787134 - Thermally assisted magnetic recording head inspection method and apparatus (2014-07-22),

9. 8656509 - Scanning probe microscope and surface shape measuring method using same (2014-02-18),

10. 8483035 - Thermally assisted magnetic recording head inspection method and apparatus (2013-07-09),

11. 8359661 - Magnetic device inspection apparatus and magnetic device inspection method (2013-01-22),

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1 patent pending:

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