Location History:
- Tokyo, JP (2015)
- Yokohama, JP (2013 - 2019)
Company Filing History:
Years Active: 2013-2019
Title: Takehiro Tachizaki: Innovator in Defect Detection Technology
Introduction
Takehiro Tachizaki is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of defect detection technology, holding a total of 11 patents. His work focuses on enhancing the capabilities of optical and electron microscopy for observing defects in various materials.
Latest Patents
One of Tachizaki's latest patents is a defect detection method and device that utilizes an electron microscope. This innovative device minutely observes defects detected by optical appearance-inspecting devices. It allows for reliable insertion of defects into the field of an electron microscope, making it a more compact solution. The configuration of the electron microscope incorporates an optimal microscope that re-detects defects. Additionally, it features a spatial filter and a distribution polarization element at the pupil plane for dark-field observations.
Career Highlights
Tachizaki has worked with notable companies such as Hitachi High-Technologies Corporation and Hitachi, Ltd. His experience in these organizations has contributed to his expertise in defect detection technologies.
Collaborations
Some of his notable coworkers include Masahiro Watanabe and Toshihiko Nakata. Their collaboration has likely played a role in advancing the research and development of defect detection methods.
Conclusion
Takehiro Tachizaki's innovative work in defect detection technology has made a significant impact in the field. His contributions continue to enhance the capabilities of microscopy and defect observation.