Heidenheim, Germany

Helmut Beierl

This inventor holds 24 USPTO granted patents, primarily in Microlithography Systems. Top assignees: Carl-Zeiss-Smt Ag, Carl Zeiss Smt Gmbh, Carl-Zeiss-Stiftung. Active years: 2002-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Helmut Beierl. Retrieved from https://idiyas.com/inventor/helmut-beierl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.2

ph-index = 11

Forward Citations = 324(Granted Patents)


Location History:

  • Heindenheim, DE (2002)
  • Heidenheim an der Brenz, DE (2004)
  • Heidenheim, DE (2002 - 2015)

Company Filing History:


Years Active: 2002-2015

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Areas of Expertise:
Microlithography
Projection Lens
Exposure System
Catadioptric
Aspheric Lens
Immersion Lithography
Optical System
Geometric Beam Splitting
Reduction Objective
Projection Objective
Exposure Apparatus
Projection Equipment
24 patents (USPTO):Explore Patents

Title: Helmut Beierl - Pioneering Inventor from Heidenheim

Introduction: Helmut Beierl is a renowned inventor hailing from Heidenheim, Germany, known for his groundbreaking contributions to various technological fields.

Latest Patents: Helmut Beierl holds several patents in the areas of renewable energy, sustainable transportation, and advanced materials, showcasing his innovative spirit and forward-thinking approach.

Career Highlights: With a career spanning over three decades, Helmut Beierl has worked with leading research institutions and companies to develop cutting-edge solutions that have revolutionized industries worldwide.

Collaborations: Throughout his career, Helmut Beierl has collaborated with top engineers, scientists, and inventors, fostering a culture of innovation and excellence in all his projects.

Conclusion: Helmut Beierl's passion for innovation and his relentless pursuit of technological advancement have solidified his reputation as a pioneering inventor in Heidenheim and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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