Palo Alto, CA, United States of America

Eliezer Rosengaus

This inventor holds 32 USPTO granted patents and 2 EPO patents, primarily in Wafer Inspection Technology. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Kla Instruments Corporation. Active years: 1988-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eliezer Rosengaus. Retrieved from https://idiyas.com/inventor/eliezer-rosengaus

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 81.3

 

Average Co-Inventor Count = 2.4

ph-index = 14

Forward Citations = 772(Granted Patents)


Company Filing History:


Years Active: 1988-2021

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Areas of Expertise:
Wafer Inspection
Defect Detection
Digital Pathology
Surface Scanning
Multi-Spectral Techniques
Hierarchical Tissue Analysis
Memory Load Balancing
Programmable Image Computer
Oblique Incidence Macro Inspection
Emission Microscopy
Edge Bead Removal
Status Polling
32 patents (USPTO):Explore Patents

Title: Eliezer Rosengaus: Innovator and Inventor Based in Palo Alto, CA

Introduction: Eliezer Rosengaus is a prolific inventor located in Palo Alto, California, with an impressive portfolio of 32 patents. His work primarily focuses on advanced systems and methods for inspection and defect detection, which contribute significantly to the fields of optics and imaging technologies.

Latest Patents: Among his latest patents, Rosengaus has developed systems and methods for the inspection of specimens. This innovative system includes an illumination subsystem designed to scan a spot across the specimen, coupled with a non-imaging detection subsystem that generates output signals from the light reflected from the specimen. A processor within the system is tasked with generating images based on these output signals and identifying defects within the specimen. The versatility of the system allows for configurations supporting both multi-spot illumination and multi-channel detection, as well as single-spot options.

In addition, Rosengaus has designed a region-adaptive defect detection method. This involves acquiring a reference image, selecting a target region, and identifying comparative regions based on a matching metric. The method further incorporates a test image and employs a defect threshold to determine if the target region contains any defects, enhancing the accuracy of inspections.

Career Highlights: Throughout his career, Rosengaus has made substantial contributions to the field of technology through various roles. He has been associated with Kla Tencor Corporation and Kla-Tencor Technologies Corporation, where he utilized his expertise in optics and imaging solutions to drive innovations that impact the industry.

Collaborations: Eliezer has collaborated with notable colleagues, including Krishnamurthy Bhaskar and Mark J. Roulo. These collaborations have fostered an environment of creativity and innovation, leading to notable advancements in optical inspection technologies.

Conclusion: Eliezer Rosengaus stands out as a significant contributor to technological advancements in specimen inspection and defect detection. With a solid foundation built from years of experience and collaboration, his inventions continue to influence and shape the future of imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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