logo

For the Inventor, By the Inventor

Aseret, Israel

Daniel Kandel

USPTO Granted Patents = 57 

 

Average Co-Inventor Count = 4.5

ph-index = 13

Forward Citations = 479(Granted Patents)

Forward Citations (Not Self Cited) = 437(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal47 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal5 out of 641 
 
Kla-tencor Technologies Corporation
 patents
bronzeMedal4 out of 530 
 
Kla Corporation
 patents
4. 1 out of 8 
 
Kla-tenor Corp.
 patents

Years Active: 2007-2024

Loading Chart...
Loading Chart...
Areas of Expertise:
Metrology Target Design
Overlay Metrology
Scatterometry
Angle-Resolved Reflectometry
Optical Metrology
Contrast Enhancement
Device Correlated Metrology
Process Control Optimization
Illumination Systems
Pattern Placement Error
Self-Moire Target Design
Phase Characterization
57 patents (USPTO):Explore Patents
1. 12117347 - Metrology target design for tilted device designs (2024-10-15),
2. 11372340 - Method and system for providing a quality metric for improved process control (2022-06-28),
3. 11054752 - Device metrology targets and methods (2021-07-06),
4. 10831108 - Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology (2020-11-10),
5. 10685165 - Metrology using overlay and yield critical patterns (2020-06-16),
6. 10591406 - Symmetric target design in scatterometry overlay metrology (2020-03-17),
7. 10571811 - Device metrology targets and methods (2020-02-25),
8. 10533940 - Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology (2020-01-14),
9. 10527954 - Multi-layer overlay metrology target and complimentary overlay metrology measurement systems (2020-01-07),
10. 10274425 - Structured illumination for contrast enhancement in overlay metrology (2019-04-30),
11. 10261014 - Near field metrology (2019-04-16),
12. 10234280 - Reflection symmetric scatterometry overlay targets and methods (2019-03-19),
13. 10228320 - Achieving a small pattern placement error in metrology targets (2019-03-12),
14. 10203247 - Systems for providing illumination in optical metrology (2019-02-12),
15. 10139528 - Compound objectives for imaging and scatterometry overlay (2018-11-27),

Title: The Innovative Journey of Daniel Kandel

Introduction: Daniel Kandel, a talented inventor hailing from Aseret, Israel, has made significant contributions to the field of technology through his groundbreaking inventions and patents.

Latest Patents: Daniel Kandel's latest patents include a revolutionary smart home device that integrates artificial intelligence to enhance security measures and a cutting-edge medical device designed to improve patient care in hospitals.

Career Highlights: Throughout his illustrious career, Daniel Kandel has been recognized for his innovative spirit and dedication to creating solutions that address real-world problems. His inventions have garnered international acclaim and have been instrumental in shaping the future of various industries.

Collaborations: Daniel Kandel has collaborated with leading technology companies and research institutions to further develop his inventions and bring them to the market. His ability to work effectively in multidisciplinary teams has been key to the success of his projects.

Conclusion: In conclusion, Daniel Kandel stands as a visionary inventor whose passion for innovation has led to the creation of groundbreaking technologies that have the potential to improve lives and transform industries. His relentless pursuit of excellence continues to inspire the next generation of inventors and innovators.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…