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For the Inventor, By the Inventor

San Jose, CA, United States of America

Cornel Bozdog

This inventor holds 16 USPTO granted patents and 5 published patent applications, primarily in Optical Metrology. Top assignees: Nova Measuring Instruments Ltd., Nova Corporation, Globalfoundries Inc.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cornel Bozdog. Retrieved from https://idiyas.com/inventor/cornel-bozdog

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 16 

% Patents Active = 100.0

Average Co-Inventor Count = 4.3

ph-index = 3

Forward Citations = 24(Granted Patents)


Location History:

  • San Jose, CA (US) (2016 - 2024)
  • Boise, ID (US) (2018 - 2024)

Company Filing History:

goldMedal11 out of 192 
 
Nova Measuring Instruments Ltd.
 patents
silverMedal3 out of 56 
 
Nova Corporation
 patents
bronzeMedal2 out of 5,671 
 
Globalfoundries Inc.
 patents
4. 2 out of 39,383 
 
Micron Technology Incorporated
 patents
5. 1 out of 1,107 
 
Globalfoundries U.S. Inc.
 patents
where one patent can have more than one assignee

Years Active: 2016-2026

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Areas of Expertise:
Optical Characterization
Non-Destructive Metrology
Thin Layers
Integrated Circuitry
DRAM Circuitry
Scatterometry
Strain Distribution
In-Situ Measurements
16 patents (USPTO):Explore Patents
1. 12742724 - Method and system for optical characterization of patterned samples (2026-09-22),
2. 12066391 - Method and system for non-destructive metrology of thin layers (2024-08-20),
3. 11906451 - Method and system for non-destructive metrology of thin layers (2024-02-20),
4. 11885737 - Method and system for optical characterization of patterned samples (2024-01-30),
5. 11668663 - Method and system for non-destructive metrology of thin layers (2023-06-06),
6. 10943907 - Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry (2021-03-09),
7. 10876959 - Method and system for optical characterization of patterned samples (2020-12-29),
8. 10707211 - Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry (2020-07-07),
9. 10534275 - Method for use in process control of manufacture of patterned sample (2020-01-14),
10. 10533961 - Method and system for non-destructive metrology of thin layers (2020-01-14),
11. 10302414 - Scatterometry method and system (2019-05-28),
12. 10209206 - Method and system for determining strain distribution in a sample (2019-02-19),
13. 10197506 - Optical metrology for in-situ measurements (2019-02-05),
14. 10030971 - Measurement system and method for measuring in thin films (2018-07-24),
15. 9915624 - Optical metrology for in-situ measurements (2018-03-13),

Title: Inventor Cornel Bozdog

Introduction: Cornel Bozdog is a renowned inventor based in San Jose, CA. He is known for his groundbreaking innovations in various fields.

Latest Patents: Cornel Bozdog holds several patents in the areas of technology and healthcare, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Bozdog has consistently pushed the boundaries of innovation. His contributions have significantly impacted the way we interact with technology on a daily basis.

Collaborations: Throughout his career, Cornel Bozdog has collaborated with leading tech companies and research institutions to bring his inventions to life. His ability to work across disciplines has led to the development of cutting-edge solutions.

Conclusion: In conclusion, Cornel Bozdog's passion for innovation and his dedication to creating impactful inventions have solidified his reputation as a pioneering inventor in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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