Chang-Cheng Hung

This inventor holds 16 USPTO granted patents, primarily in Semiconductor Manufacturing. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2002-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang-Cheng Hung. Retrieved from https://idiyas.com/inventor/chang-cheng-hung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 16

% Patents Active = 37.5

Average Co-Inventor Count = 3.9

ph-index = 3

Forward Citations = 47(Granted Patents)

Location History:

Hsin-Chu, TW (2002 - 2010)
Jubei, TW (2005 - 2012)
Jhubei, TW (2008 - 2014)
Hsinchu County, TW (2022)

Company Filing History:

16 out of 42,965

Taiwan Semiconductor Manufacturing Comp. Ltd.

patents

Years Active: 2002-2022

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Areas of Expertise:

Semiconductor Package

Photomask

Wafer Inspection

Light Scattering

Critical Dimension Control

Defect Review

Electrostatic Damage

Ion Beams

Transmittance Masks

Dimension Monitoring

Particle Removal

16 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11243573 - Semiconductor package, display apparatus and manufacturing method of semiconductor package (2022-02-08),

2. 8624345 - Photomask and photomask substrate with reduced light scattering properties (2014-01-07),

3. 8617410 - Method and system for wafer inspection (2013-12-31),

4. 8198118 - Method for forming a robust mask with reduced light scattering (2012-06-12),

5. 8046860 - System and method for removing particles in semiconductor manufacturing (2011-11-01),

6. 8038897 - Method and system for wafer inspection (2011-10-18),

7. 7819980 - System and method for removing particles in semiconductor manufacturing (2010-10-26),

8. 7759136 - Critical dimension (CD) control by spectrum metrology (2010-07-20),

9. 7469057 - System and method for inspecting errors on a wafer (2008-12-23),

10. 7460251 - Dimension monitoring method and system (2008-12-02),

11. 7162071 - Progressive self-learning defect review and classification method (2007-01-09),

12. 6861179 - Charge effect and electrostatic damage prevention method on photo-mask (2005-03-01),

13. 6858354 - Method to prevent side lobe on seal ring (2005-02-22),

14. 6858353 - Increased-contrast film for high-transmittance attenuated phase-shaft masks (2005-02-22),

15. 6653029 - Dual-focused ion beams for semiconductor image scanning and mask repair (2003-11-25),

Title: The Innovative Journey of Chang-Cheng Hung

Introduction: Chang-Cheng Hung, a talented inventor hailing from Jhubei, Taiwan, has made significant contributions to the field of technology with his groundbreaking inventions.

Latest Patents: Chang-Cheng Hung's latest patents include a cutting-edge smart home device that revolutionizes the way we interact with our living spaces, and a sustainable energy solution that aims to reduce carbon emissions.

Career Highlights: With a career spanning over two decades, Chang-Cheng Hung has established himself as a visionary inventor with a keen eye for identifying gaps in the market and developing innovative solutions. His work has been recognized globally, earning him prestigious awards in the technology sector.

Collaborations: Throughout his career, Chang-Cheng Hung has collaborated with leading tech companies and research institutions to bring his inventions to life. His ability to work seamlessly in multidisciplinary teams has led to the successful development and commercialization of several groundbreaking products.

Conclusion: Chang-Cheng Hung's passion for innovation and his relentless drive to push the boundaries of technology make him a true pioneer in the field of inventions. His contributions continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]