IDiyas

For the Inventor, By the Inventor

Palo Alto, CA, United States of America

Anantha R Sethuraman

USPTO Granted Patents = 16 

Average Co-Inventor Count = 5.1

ph-index = 6

Forward Citations = 107(Granted Patents)


Company Filing History:

goldMedal9 out of 641 
 
Kla-tencor Technologies Corporation
 patents
silverMedal6 out of 13,684 
 
Applied Materials, Inc.
 patents
bronzeMedal1 out of 1,787 
 
Kla Tencor Corporation
 patents

Years Active: 2003-2021

Loading Chart...
16 patents (USPTO):Explore Patents
1. 11187992 - Predictive modeling of metrology in semiconductor processes (2021-11-30),
2. 11088039 - Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data (2021-08-10),
3. 10614262 - Method of predicting areas of vulnerable yield in a semiconductor substrate (2020-04-07),
4. 10579769 - Using design proximity index and effect-to-design proximity ratio to control semiconductor processes and achieve enhanced yield (2020-03-03),
5. 10579041 - Semiconductor process control method (2020-03-03),
6. 10481199 - Data analytics and computational analytics for semiconductor process control (2019-11-19),
7. 8831767 - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool (2014-09-09),
8. 8010222 - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool (2011-08-30),
9. 7332438 - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool (2008-02-19),
10. 7175503 - Methods and systems for determining a characteristic of polishing within a zone on a specimen from combined output signals of an eddy current device (2007-02-13),
11. 7052369 - Methods and systems for detecting a presence of blobs on a specimen during a polishing process (2006-05-30),
12. 7030018 - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool (2006-04-18),
13. 6935922 - Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing (2005-08-30),
14. 6884146 - Systems and methods for characterizing a polishing process (2005-04-26),
15. 6866559 - Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad (2005-03-15),

Title: The Innovations of Anantha R Sethuraman

Introduction

Anantha R Sethuraman is an accomplished inventor based in Palo Alto, CA, known for his significant contributions to the field of semiconductor manufacturing. With a portfolio of 16 patents, he has demonstrated an exceptional ability to develop innovative solutions that enhance production efficiency and quality control in the semiconductor industry.

Latest Patents

Among his latest patents, Anantha has made notable advancements in predictive modeling and data management related to silicon wafer manufacturing. His first patent involves predictive modeling of metrology in semiconductor processes. This innovation encompasses methods for receiving data from manufacturing tools and utilizing that data to generate predictive information about the quality of silicon wafers. This information aids manufacturing systems in determining the need for corrective actions.

Another significant patent focuses on data management and mining to correlate various factors affecting silicon wafer manufacturing. The process involves receiving defect information, identifying critical areas on silicon wafers, and assessing the probability of defects. The results of this analysis provide essential predictive information to manufacturing systems, enabling timely corrective actions to improve overall manufacturing outcomes.

Career Highlights

Anantha R Sethuraman has built a commendable career while working with renowned companies in the semiconductor sector. He has been associated with Kla-Tencor Technologies Corporation and Applied Materials, Inc., where he played vital roles in enhancing manufacturing processes and product quality. His work is characterized by a commitment to innovation and excellence.

Collaborations

Throughout his career, Anantha has collaborated with esteemed colleagues such as Kurt Lehman and Charles L Chen. These partnerships have focused on intersecting areas of research and development, ultimately contributing to groundbreaking advancements in semiconductor technology.

Conclusion

Anantha R Sethuraman's contributions to the field of semiconductor manufacturing illustrate the power of innovation in improving production methodologies and quality assurance. His 16 patents reflect a deep understanding of the complexities involved in wafer manufacturing, highlighting his role as a key contributor to the advancement of semiconductor technology. Through his advancements, Anantha continues to inspire future innovations in the industry.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…