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USPTO Data Jan 1 1976 - Oct 20 2026
748 Patents
#7 in Yokohama
#277 in Japan
#1,330 in the World
Nuflare Technology, Inc.
Forward Citations = 2,204
312 inventors:
Nuflare Technology, Inc.
% Expired Patents = 11.8
EPO Patents = 3
Trademarks = 5
Forward Citations = 2,204
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312 inventors (with patents filed for the assignee):
Hiroshi Matsumoto (58 out of 145 patents)
Munehiro Ogasawara (49 out of 72 patents)
Riki Ogawa (47 out of 64 patents)
4. Kunihiko Suzuki (42 out of 149 patents)
5. Takayuki Abe (34 out of 107 patents)
6. Yasuo Kato (32 out of 41 patents)
7. Hideo Tsuchiya (30 out of 54 patents)
8. Jun Yashima (30 out of 30 patents)
9. Nobutaka Kikuiri (26 out of 43 patents)
10. Noriaki Nakayamada (25 out of 27 patents)
11. Kenichi Yasui (24 out of 24 patents)
12. Takanao Touya (24 out of 24 patents)
13. Hideo Inoue (23 out of 24 patents)
14. Rieko Nishimura (22 out of 22 patents)
15. Hirofumi Morita (21 out of 35 patents)
Core Competencies:
Charged Particle Beam
Defect Inspection
Pattern Inspection
Electron Beam
Multi-Charged Particle
Inspection Apparatus
Susceptor
Film Deposition
Vapor Phase Growth
Image Acquisition
Adjustment Method
Thermal Field Emission
748 patents:
Company Overview
Nuflare Technology, Inc., based in Yokohama, Japan, specializes in advanced charged particle beam writing technologies. The company focuses on developing innovative solutions for defect and pattern inspection, utilizing electron beam and multi-charged particle technologies. Nuflare's expertise extends to the design and manufacture of inspection apparatuses and film deposition systems, catering to the semiconductor industry and enhancing the precision of microfabrication processes. Their commitment to research and development positions them as a key player in the field of nanotechnology.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nuflare Technology, Inc.. Retrieved from https://idiyas.com/company/nuflare-technology
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]