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For the Inventor, By the Inventor

Tokyo, Japan

Nobutaka Kikuiri

This inventor holds 43 USPTO granted patents and 3 published patent applications, primarily in Inspection Technology. Top assignees: Nuflare Technology, Inc., Kabushiki Kaisha Toshiba, Nec Corporation. Active years: 1992-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobutaka Kikuiri. Retrieved from https://idiyas.com/inventor/nobutaka-kikuiri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 43 

% Patents Active = 74.4

Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 223(Granted Patents)


Location History:

  • Kawasaki, JP (1994)
  • Tokyo, JP (1992 - 2017)
  • Kanagawa, JP (2015 - 2018)
  • Koganei, JP (2005 - 2020)

Company Filing History:

goldMedal26 out of 749 
 
Nuflare Technology, Inc.
 patents
silverMedal17 out of 53,286 
 
Kabushiki Kaisha Toshiba
 patents
bronzeMedal2 out of 36,735 
 
Nec Corporation
 patents
where one patent can have more than one assignee

Years Active: 1992-2020

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Areas of Expertise:
Image Acquisition
Inspection Apparatus
Pattern Inspection
Mask Evaluation
Ultrafine Lithography
Fuel Cell System
Monitoring Apparatus
Active Camera
Mastering Apparatus
Exposure Apparatus
Positional Deviation
Sensitivity Evaluation
43 patents (USPTO):Explore Patents
1. 10777384 - Multiple beam image acquisition apparatus and multiple beam image acquisition method (2020-09-15),
2. 10629406 - Optical system adjustment method of image acquisition apparatus (2020-04-21),
3. 10572995 - Inspection method and inspection apparatus (2020-02-25),
4. 10504219 - Inspection apparatus and inspection method (2019-12-10),
5. 10281415 - Pattern inspection method and pattern inspection apparatus (2019-05-07),
6. 10127648 - Pattern inspection apparatus and pattern inspection method (2018-11-13),
7. 10094791 - Pattern inspection apparatus (2018-10-09),
8. 10026011 - Mask inspection apparatus, mask evaluation method and mask evaluation system (2018-07-17),
9. 9922415 - Inspection method, inspection apparatus, and inspection system (2018-03-20),
10. 9869650 - Pattern inspection apparatus (2018-01-16),
11. 9811896 - Measuring apparatus (2017-11-07),
12. 9728373 - Pattern inspection apparatus and pattern inspection method (2017-08-08),
13. 9691143 - Inspection apparatus and inspection apparatus system (2017-06-27),
14. 9659361 - Measuring apparatus that generates positional deviation distribution of a pattern on a target object (2017-05-23),
15. 9626755 - Mask inspection apparatus and mask inspection method (2017-04-18),

Title: The Innovative Mind of Nobutaka Kikuiri

Introduction: Nobutaka Kikuiri is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Nobutaka Kikuiri holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous dedication to pushing the boundaries of what is possible.

Career Highlights: Throughout his illustrious career, Nobutaka Kikuiri has worked with leading tech companies and research institutions, spearheading projects that have revolutionized various industries. His keen eye for detail and passion for innovation have earned him a reputation as a visionary in the field.

Collaborations: Nobutaka Kikuiri has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence in all his projects. His ability to work seamlessly in interdisciplinary teams has led to the development of cutting-edge solutions that have had a lasting impact.

Conclusion: Nobutaka Kikuiri's relentless pursuit of innovation and his commitment to pushing the boundaries of technology make him a true pioneer in the world of inventions. His work continues to inspire future generations of inventors to dream big and create a better tomorrow.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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